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分析测试百科网 > 日本电子株式会社(JEOL)>最新信息

日本电子发布台式扫描电镜JCM-6000Plus,具有高灵敏度半导体检测器可进行高效分析

发布: 2015-08-06 19:19:17来源: 日本电子株式会社(JEOL)

Release of New Benchtop SEM JCM-6000Plus NeoScope™ - Equipped with high-sensitivity semiconductor detector, delivering efficient analysis -

JEOL Ltd. (President Gon-emon Kurihara) has developed a new benchtop scanning electron microscope, JCM-6000Plus NeoScope™, designed to fulfill the diversifying needs of customers and expansion of the market. Sale of the new model will start in August 2015.

Product development background

Scanning electron microscopes are being utilized in an expanding range of fields, such as medicine, biology, nanotechnology, metals, semiconductors, and ceramics. In addition, the applications cover a wide spectrum, from basic research to quality control at the manufacturing site.
The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The series continues to include the high-vacuum functionality and secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification.

Main Features

  1. Touch panel allowing easy operation, and a full complement of automated functions.
  2. Allows observation of secondary electron images under high vacuum conditions.
  3. Improved image quality of backscattered electron images.
  4. A wealth of optional functions available, such as element analysis.
  5. Sleek exterior design with a compact footprint.

Main Specifications

Magnification x10 to x60,000
Imaging modes High-vacuum/ Secondary electron image, Backscattered electron image (composition, topography, shadow),
Low-vacuum/ Backscattered electron image (composition, topography, shadow)
Accelerating voltage 5kV/10kV/15kV (3 stages)
Electron gun Small gun with integrated filament / Wehnelt
Specimen stage Manual control, 2-axis stage
Movement range               X:35mm Y:35mm
Maximum specimen size    70mm diameter
Maximum specimen height   50mm
Automated functions Full-auto, Auto-focus, Auto-stigma, Auto-contrast & brightness,
Auto gun alignment
Operation Via touch panel and mouse operation
Digital image display 1280×1024 pixels
Options EDS, Tilt/rotation motorized holder, 2-axis motorized stage
JCM-6000Plus

Annual unit sales target

200 units/ year (initial year)


厂家名称

日本电子株式会社(JEOL Ltd., )在各地设有服务机构,能够迅速、妥善地应对全球客户的需求。我们的目标旨在为所有顾客提供满意的、具有一贯服务能力的服务体系。JEOL目前面向中国及全球,生产销售各型扫描电子显微镜、透射电子显微镜、电子探...

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