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HR Evo Nano 原子力- 拉曼联用系统

tel: 400-6699-117 6216

堀场HORIBA拉曼光谱仪, 高度集成原子力拉曼系统,高光谱分辨率、超低波数探测、近红外光致发光探测,使用便捷,能快速得到可靠的结果。......

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SmartSPM Scanner and Base 扫描仪和底座

样品扫描范围:100 µm x 100 µm x 15 µm (±10 %)

Scanning type by sample XY non-linearity 0.05 %; Z non-linearity 0.05 %


噪音Noise

0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on

0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off

< 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth


共振频率Resonance frequency

XY: 7 kHz (unloaded)

Z: 15 kHz (unloaded)


X, Y, Z轴向运动 movement

Digital closed loop control for X, Y, Z axes

Active elimination of XY phase lag, overshooting & ringing results in fast scanning without any dynamic image distortion

Motorized Z approach range 18 mm


样品尺寸:zei大40 x 50 mm, 15 mm厚

Sample positioning Motorized sample positioning range 5 x 5 mm

Positioning resolution 1 µm


AFM探头 Head

Laser wavelength 1300 nm, non-interfering with spectroscopic detector

Registration system noise Down to < 0.1 nm

Alignment Fully automated cantilever and photodiode alignment

Probe access Free access to the probe for additional external manipulators and probes


SPM测量模式

Contact AFM in air/(liquid optional) 

Conductive AFM (optional) 

Nanolithography

Semicontact AFM in air/(liquid optional) 

Magnetic Force Microscopy (MFM) 

Nanomanipulation

Non -contact AFM 

Kelvin Probe (Surface Potential Microscopy, SKM, KPFM) 

STM (optional)

Phase imaging 

Capacitance and Electric Force Microscopy (EFM) 

Photocurrent Mapping (optional)

Lateral Force Microscopy (LFM 

Force curve measurement 

Volt-ampere characteristic measurements (optional)

Force Modulation 

Piezo Response Force Microscopy (PFM)


光谱模式Spectroscopy Modes

Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy

Tip-Enhanced Fluorescence (TEFS)

Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes

Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)

Conductive AFM Unit (optional)


电流范围Current range

100 fA ~ 10 µA

3 current ranges (1 nA, 100 na and 10 µA) switchable from the software


可选附件Optical Access

Capability to use simultaneously top and side plan apochromat objectives

Up to 100x, NA = 0.7 from top or side

Up to 20x and 100x simultaneously


Cloosed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment

Range 20 µm x 20 µm x 15 µm

Resolution: 1 nm



光谱仪Spectrometer

Fully automated high resolution LabRAM HR Evolution micro-spectrometers,functional as stand-alone micro-Raman microscope

波长范围:50 cm-1 ~ 4000 cm -1 或低至10 cm -1  with Ultra Low Frequency (ULF) filter option

Gratings光栅

Selection of gratings from 150 g/mm to 3600 g/mm

2 gratings on computer controlled turret, kinematically mounted and easily exchangeable

选项设计:Achromatic spectrograph and achromatic coupling optics

自动化:Fully motorized, software controlled operation


检测Detection

Full range of CCD detectors and EMCCDs and InfraRed detectors: InGaAs array, single channel extended InGaAs, InSb, dTe,...


激光源Laser Sources

Wavelengths Full range of wavelengths from DUV (229 nm) to IR (up to 2.2 µm)

Typical wavelength 532 nm, 638 nm, 785 nm


自动化Automation

Fully automated laser and filter switching for up to 3 simultaneous lasers

Laser polarization selection and spectral analyzer options for all wavelengths


软件Software

Integrated software package including full featured SPM, spectrometer and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection and spectral search functionalities.










厂家资料

地址:上海市天山西路1068号联强国际广场A栋1层D单元

电话:400-6699-117 转 6216

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