Specifications

• Head in 2 versions available

• UV transparency version for top view sample illumination with UV-light

• Fiber port version for fiber SNOM applications

• Atomic lattice resolution on inverted microscope in closed-loop (< 0.030nm RMS z noise level)

• Ultra-low noise level of cantilever deflection detection system <2pm RMS (0.1Hz-1kHz) and high detector bandwidth of 8MHz for high speed signal capture

• Tip-scanning, stand-alone system, with a rigid low-noise design and drift-minimized mechanics – the best choice for simultaneous AFM and laser scanning (LSM) experiments

• IR deflection detection light source with low coherence for interference-free measurements

• The only liquid-safe AFM with integrated vapor barrier, special encapsulated piezo drives and tip-moving design

• Transmission illumination with standard condensers for precise brightfield, DIC and phase contrast

• Scanner unit

• Best closed-loop AFM on the market for reproducible tip positioning and long time position stability

• 100 x 100 x 15μm3 scan range

• Position noise level <0.15nm RMS in xy (in closed-loop) and 0.06nm RMS sensor noise level in z (3kHz bw)

Vortis™ SPMControl electronics

• State-of-the-art digital controller with lowest noise levels and highest flexibility