货号：912A0890, Evolution 201 Spectrophotometer plus Tablet Control Module - International
| 产品规格 | - |
|---|---|
| 准确度（光度） | 0.5: ±0.004; 1: ±0.006; 2: ±0.010; Measured at 440nm using neutral density filters traceable to NIST™ |
| 基线平坦度 | ±0.0010A, 200-800nm, 1.0nm SBW, smoothing |
| 射束几何形状 | Double-beam |
| 认证/合规 | ISO 9001:2008 |
| 连接 | USB or RS-232 |
| Data Interval | 10, 5, 2, 1.0, 0.5, 0.2, 0.1nm |
| 深度（英制） | 24.3 in. |
| 深度（公制） | 62.2mm |
| 描述 | Cutting-edge instrumentation, intuitive and powerful software, and a wide range of accessories consistently deliver high quality results and improved productivity. |
| 检测器类型 | Dual Silicon Photodiodes |
| Dimensions (L x W x H) | 62.2 x 48.6 x 27.9cm |
| 显示 | None |
| 漂移 | <0.0005A/hr, 500nm, 1.0nm SBW, 1 hr warm-up |
| Electrical Requirements | 100-240V 50-60Hz, selected automatically,150W maximum |
| 物品描述 | Evolution 201 Tablet Control Module Intl |
| 键盘 | Sealed membrane |
| 灯 | Xenon Flash Lamp, 3 year warranty (7 years typical lifetime) |
| 噪声 | 0A:<0.00015A; 1A:<0.00025A; 2A:<0.00080A; 260nm, 1.0nm SBW, RMS |
| 操作系统 | INSIGHT 2 Software is compatible with Windows™ 7 and Windows 8.1 Professional Editions |
| 光学设计 | Double Beam with sample and reference cuvette positions; Czerny-Turner Monochromator |
| 路径长度（公制） | Up to 100mm cuvettes |
| Pharmacopoeia Compliance Testing | Resolution (Toluene in Hexane): ≥1.8A Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl Wavelength Accuracy: ±.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line |
| Photometric Accuracy Instrument | 1A: ±0.006A 2A: ±0.010A Measured at 440nm using calibrated neutral density filters traceable to NIST |
| Photometric Display | -0.3 to 4.0A |
| Photometric Range | >3.5A |
| Photometric Repeatability | ±0.0002A |
| Scan Ordinate Modes | Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity |
| 扫描速度. | <1-6000nm/min, variable |
| 光谱带宽 | 1.0nm |
| 类型 | Evolution 201 Spectrophotometer plus Tablet Control Module - International |
| 瓦数 | 150W max. |
| 波长精度 | ±0.5nm (541.9, 546.1nm mercury lines); ±0.8nm (full range 190 to 1100nm) |
| 波长范围 | 190 to 1100nm |
| 波长重复性 | ≤0.05nm (546.1nm mercury line, SD of 10 measurements) |
| 波长扫描速度 | <1 to 6000; variable |
| 重量（公制） | 14.4kg |
货号：912A0889，Evolution 220 Spectrophotometer plus Tablet Control Module - International
| 产品规格 | - |
|---|---|
| 基线平坦度 | ±0.0010A, 200-800nm, 1.0nm SBW, smoothing |
| Data Interval | 10, 5, 2, 1.0, 0.5, 0.2, 0.1nm |
| 描述 | Cutting-edge instrumentation, intuitive and powerful software, and a wide range of accessories consistently deliver high quality results and improved productivity |
| 检测器类型 | Dual Silicon Photodiodes |
| Dimensions (L x W x H) | 62.2 x 48.6 x 27.9cm |
| 显示 | None |
| 漂移 | <0.0005A/hr, 500nm, 1.0nm SBW, 1 hr warm-up |
| Electrical Requirements | 100-240V 50-60Hz, selected automatically,150W maximum |
| 物品描述 | Evolution 220 Tablet Control Module Intl |
| 键盘 | Sealed membrane |
| 灯 | Xenon Flash Lamp, 3 year warranty (7 years typical lifetime) |
| 噪声 | 0A:<0.00015A; 1A:<0.00025A; 2A:<0.00080A; 260nm, 1nm SBW, RMS |
| 操作系统 | Microsoft Windows™ XP embedded. INSIGHT 2 Software is also compatible with Windows 7 and Windows 8.1 Professional Editions. |
| 光学设计 | Double Beam with sample and reference cuvette positions; Application Focused Beam Geometry; Czerny-Turner Monochromator |
| Pharmacopoeia Compliance Testing | (Guaranteed Performance Specifications) Resolution (toluene in Hexane): ≥1.8A Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010A Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl Wavelength Accuracy: ±0.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line |
| Photometric Accuracy Instrument | 1A: ±0.006A 2A: ±0.010A Measured at 440nm using calibrated neutral density filters traceable to NIST |
| Photometric Display | -0.3 to 4.0A |
| Photometric Range | >3.5A |
| Photometric Repeatability | ±0.0002A |
| Scan Ordinate Modes | Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity |
| 扫描速度. | <1-6000nm/min, variable |
| 光谱带宽 | Variable: 1.0nm; 2.0nm; AFBG Microcell optimized; AFBG Fiber optic optimized; AFBG Materials optimized |
| 类型 | Evolution 220 Spectrophotometer plus Tablet Control Module - International |
| 波长精度 | ±0.5nm (541.9, 546.1nm mercury lines), ±0.8nm (full range 190 to 1100nm) |
| 波长范围 | 190 to 1100nm |
| 波长重复性 | ≤0.05nm (546.11nm mercury line, SD of 10 measurements) |
| 重量（公制） | 14.4kg |
Evolution 220 本地控制光谱 参考指标
| Accuracy (Photometric) | 0.5: ±0.0004; 1: ±0.006; 2: ±0.010; Measured at 440nm using neutral density filters traceable to NIST™/NLPL |
| Baseline Flatness | ±0.0010A, 200-800nm, 1.0nm SBW, smoothing |
| Beam Geometry | Double-beam with Application Focused Beam Geometry |
| Certifications/Compliance | ISO 9001:2008 |
| Connections | USB or RS-232 |
| Data Interval | 10, 5, 2, 1.0, 0.5, 0.2, 0.1nm |
| Depth (English) | 24.3 in. |
| Depth (Metric) | 62.2mm |
| Description | Cutting-edge instrumentation, intuitive and powerful software, and a wide range of accessories consistently deliver high quality results and improved productivity |
| Detector Type | Dual Silicon Photodiodes |
| Dimensions (L x W x H) | 62.2 x 48.6 x 27.9cm |
| Display | Touchscreen LCD panel; 800 x 480; 17.8cm (7 in) diagonal |
| Electrical Requirements | 100-240V 50-60Hz, selected automatically, 150W maximun |
| Item Description | Evolution 220 LC |
| Keypad | Sealed membrane |
| Lamp | Xenon Flash Lamp, 3 year warranty (7 years typical lifetime) |
| Noise | 0A:<0.00015A; 1A:<0.00025A; 2A:<0.00080A; 260nm, 1nm SBW, RMS |
| Operating System | Microsoft Windows™ XP embedded. INSIGHT 2 Software is also compatible with Windows 7 and Windows 8.1 Professional Edition and can be installed on a computer attached to the instrument. |
| Optical Design | Double Beam with sample and reference cuvette positions; Application Focused Beam Geometry; Czerny-Turner Monochromator |
| Pharmacopoeia Compliance Testing | (Guaranteed Performance Specifications) Resolution (Toluene in Hexane): ≥1.8A Photometric Accuracy (60 mg/L L2Cr2O7): ±0.010A Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl Wavelength Accuracy: ±0.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line |
| Photometric Accuracy Instrument | 1A: ±0.006A 2A: ±0.010A Measured at 440nm using calibrated neutral density filters traceable to NIST |
| Photometric Display | -0.3 to 4.0A |
| Photometric Range | >3.5A |
| Photometric Repeatability | ±0.0002A |
| Scan Ordinate Modes | Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity |
| Scan Speed | <1-6000nm/min, variable |
| Spectral Bandwidth | Variable: 1.0nm; 2.0nm; AFBG Microcell optimized; AFBG Fiber optic optimized; AFBG Materials optimized |
| Type | Evolution 220 Local Control Spectrophotometer |
| Wavelength Accuracy | ±0.5nm (541.9, 546.1nm mercury lines), ±0.8nm (full range 190 to 1100nm) |
| Wavelength Range | 190 to 1100nm |
| Wavelength Repeatability | ≤0.05nm (546.11nm mercury line, SD of 10 measurements) |
Evolution 220 计算机控制光谱 参考指标
| Baseline Flatness | ±0.0010A, 200-800nm, 1.0nm SBW, smoothing |
| Data Interval | 10, 5, 2, 1.0, 0.5, 0.2, 0.1nm |
| Description | Cutting-edge instrumentation, intuitive and powerful software, and a wide range of accessories consistently deliver high quality results and improved productivity |
| Detector Type | Dual Silicon Photodiodes |
| Dimensions (L x W x H) | 62.2 x 48.6 x 27.9cm |
| Display | None |
| Drift | <0.0005A/hr, 500nm, 1.0nm SBW, 1 hr warm-up |
| Electrical Requirements | 100-240V 50-60Hz, selected automatically, 150W maximum |
| Item Description | Evolution 220 PC |
| Keypad | Sealed membrane |
| Lamp | Xenon Flash Lamp, 3 year warranty (7 years typical lifetime) |
| Noise | 0A:<0.00015A; 1A:<0.00025A; 2A:<0.00080A; 260nm, 1nm SBW, RMS |
| Operating System | Microsoft Windows™ XP embedded. INSIGHT 2 Software is also compatible with Windows 7 and Windows 8.1 Professional Editions. |
| Optical Design | Double Beam with sample and reference cuvette positions; Application Focused Beam Geometry; Czerny-Turner Monochromator |
| Pharmacopoeia Compliance Testing | (Guaranteed Performance Specifications) Resolution (toluene in Hexane): ≥1.8A Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010A Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl Wavelength Accuracy: ±0.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line |
| Photometric Accuracy Instrument | 1A: ±0.006A 2A: ±0.010A Measured at 440nm using calibrated neutral density filters traceable to NIST |
| Photometric Display | -0.3 to 4.0A |
| Photometric Range | >3.5A |
| Photometric Repeatability | ±0.0002A |
| Scan Ordinate Modes | Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity |
| Scan Speed | <1-6000nm/min, variable |
| Spectral Bandwidth | Variable: 1.0nm; 2.0nm; AFBG Microcell optimized; AFBG Fiber optic optimized; AFBG Materials optimized |
| Type | Evolution 220 Computer Control Spectrophotometer |
| Wavelength Accuracy | ±0.5nm (541.9, 546.1nm mercury lines), ±0.8nm (full range 190 to 1100nm) |
| Wavelength Range | 190 to 1100nm |
| Wavelength Repeatability | ≤0.05nm (546.11nm mercury line, SD of 10 measurements) |
| Weight (Metric) | 14.4kg |
Evolution 201本地控制光谱仪 指标
| Accuracy (Photometric) | 0.5: ±0.0004; 1: ±0.006; 2: ±0.010; Measured at 440nm using neutral density filters traceable to NIST™/NLPL |
| Baseline Flatness | ±0.0010A, 200-800nm, 1.0nm SBW, smoothing |
| Beam Geometry | Double-beam |
| Certifications/Compliance | ISO 9001:2008 |
| Connections | USB or RS-232 |
| Data Interval | 10, 5, 2, 1.0, 0.5, 0.2, 0.1nm |
| Depth (English) | 24.3 in. |
| Depth (Metric) | 62.2mm |
| Description | Cutting-edge instrumentation, intuitive and powerful software, and a wide range of accessories consistently deliver high quality results and improved productivity |
| Detector Type | Dual Silicon Photodiodes |
| Dimensions (L x W x H) | 62.2 x 48.6 x 27.9cm |
| Display | Touchscreen LCD Panel; 800 x 480; 17.8cm (7 in.) diagonal |
| Drift | <0.0005A/hr, 500nm, 1.0nm SBW, 1 hr warm-up |
| Electrical Requirements | 100-240V 50-60Hz, selected automatically, 150W maximum |
| Item Description | Evolution 201 LC |
| Interface | On-Board Control |
| Keypad | Sealed membrane |
| Lamp | Xenon Flash Lamp, 3 year warranty (7 years typical lifetime) |
| Min. Data Interval | 1nm |
| Noise | 0A:<0.00015A 1A: <0.00025A 2A: <0.00080A 260 nm, 1.0 nm SBW, RMS |
| Operating System | Microsoft™ Windows™ XP embedded INSIGHT 2 Software is also compatible with Windows™ 7 and Windows 8.1 Professional Editions and can be installed on a computer attached to the instrument |
| Optical Design | Double Beam with sample and reference cuvette positions; Czerny-Turner Monochromator |
| Pathlength (Metric) | Up to 100mm cuvettes |
| Pharmacopoeia Compliance Testing | (Guaranteed Performance Specifications) Resolution (Toluene in Hexane): ≥1.8A Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A Stray Light: ≤1%T at 198nm:KCL; ≤0.05%AT at 220nm: Nal, KI Wavelength Accuracy: ±0.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line |
| Photometric Accuracy Instrument | 1A: ±0.006 A 2A: ±0.010 A Measured at 440 nm using calibrated neutral density filters traceable to NIST |
| Photometric Display | -0.3 to 4.0A |
| Photometric Range | >3.5A |
| Repeatability | ±0.0002A |
| Scan Ordinate Modes | Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R, log (Abs), Abs*Factor, Intensity |
| Scan Speed | <1-6000nm/min, variable |
| Spectral Bandwidth | 1.0nm |
| Stray Light | KCl, 198nm: =1% T, NaI, 220nm: =0.005%; NaNO2 340nm<0.05% T |
| Wavelength Accuracy | ±0.5nm (541.9nm mercury lines); ±0.8nm (full range 190 to 1100nm) |
| Wavelength Range | 190 to 1100nm |
| Wavelength Repeatability | =<0.5nm (541.9nm mercury line, SD of 10 measurements) |
| Weight (Metric) | 14.4kg |
| Product Type | Evolution 201 Local Control Spectrophotometer |
Evolution 201计算机控制光谱仪指标
| Accuracy (Photometric) | 0.5: ±0.0004; 1: ±0.006; 2: ±0.010; Measured at 440nm using neutral density filters traceable to NIST™/NLPL |
| Baseline Flatness | ±0.0010A, 200-800nm, 1.0nm SBW, smoothing |
| Beam Geometry | Double-beam |
| Certifications/Compliance | ISO 9001:2008 |
| Connections | USB or RS-232 |
| Data Interval | 10, 5, 2, 1.0, 0.5, 0.2, 0.1nm |
| Depth (English) | 24.3 in. |
| Depth (Metric) | 62.2mm |
| Description | Cutting-edge instrumentation, intuitive and powerful software, and a wide range of accessories consistently deliver high quality results and improved productivity. |
| Detector Type | Dual Silicon Photodiodes |
| Dimensions (L x W x H) | 62.2 x 48.6 x 27.9cm |
| Display | None |
| Drift | <0.0005A/hr, 500nm, 1.0nm SBW, 1 hr warm-up |
| Electrical Requirements | 100-240V 50-60Hz, selected automatically, 150W maximum |
| Item Description | Evolution 201 PC |
| Keypad | Sealed membrane |
| Lamp | Xenon Flash Lamp, 3 year warranty (7 years typical lifetime) |
| Noise | 0A:<0.00015A; 1A:<0.00025A; 2A:<0.00080A; 260nm, 1.0nm SBW, RMS |
| Operating System | INSIGHT 2 Software is compatible with Windows™ 7 and Windows 8.1 Professional Editions |
| Optical Design | Double Beam with sample and reference cuvette positions; Czerny-Turner Monochromator |
| Pathlength (Metric) | Up to 100mm cuvettes |
| Pharmacopoeia Compliance Testing | Resolution (Toluene in Hexane): ≥1.8A Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A Stray Light: ≤1%T at 198nm: KCI; ≤0.05%AT at 220nm: Nal, Kl Wavelength Accuracy: ±.5nm 541.9, 546.1nm Hg emission lines, ±0.8nm full range Wavelength Repeatability: ≤0.05nm, repetitive scanning of 546.1nm Hg emission line |
| Photometric Accuracy Instrument | 1A: ±0.006A 2A: ±0.010A Measured at 440nm using calibrated neutral density filters traceable to NIST |
| Photometric Display | -0.3 to 4.0A |
| Photometric Range | >3.5A |
| Photometric Repeatability | ±0.0002A |
| Scan Ordinate Modes | Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity |
| Scan Speed | <1-6000nm/min, variable |
| Spectral Bandwidth | 1.0nm |
| Type | Evolution 201 Computer Control Spectrophotometer |
| Wattage | 150W max. |
| Wavelength Accuracy | ±0.5nm (541.9, 546.1nm mercury lines); ±0.8nm (full range 190 to 1100nm) |
| Wavelength Range | 190 to 1100nm |
| Wavelength Repeatability | ≤0.05nm (546.1nm mercury line, SD of 10 measurements) |
| Wavelength Scan Speed | <1 to 6000; variable |
| Weight (Metric) | 14.4kg |
请扫描二维码查看详细参数
经销商
|
除厂家/中国总经销商外，我们找不到 Evolution 201/220 紫外可见分光光度计 的一般经销商信息，有可能该产品在中国没有其它经销商。
如果您是，请告诉我们，我们的邮件地址是：sales@antpedia.net 请说明: 1.产品名称 2.公司介绍 3.联系方式 |
紫外可见分光光度计
售后服务
我会维修/培训/做方法
如果您是一名工程师或者专业维修科学 仪器的服务商，都可参与登记，我们的平台 会为您的服务精确的定位并展示。
