奥林巴斯LEXT OLS4500 纳米检测显微镜 _参数指标

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奥林巴斯LEXT OLS4500 纳米检测显微镜

tel: 400-6699-117 转 6030

奥林巴斯扫描探针/原子力显微镜SPM/AFM, 轻松实现从毫米到纳米无缝转换测量。兼具激光显微镜和探针显微镜功能的一体机。......

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参数指标

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　　LEXT OLS4500 纳米检测显微镜功能上的新特性：

　　单一扫描区域里的高分辨率观察和高精确性测量

　　设计便于新手操作，包括自动3D图像获取功能

　　3D图像获取速度大约是现有奥林巴斯各型产品的两倍

　　组合了光学显微镜、激光显微镜和探针显微镜功能的一体机

Main Unit

LSM Section	Light Source/Detector			Light Source: 405 nm Semiconductor Laser, Detector: Photomultiplier
	Total Magnification			108x – 17,280x
	Zoom			Optical Zoom: 1x – 8x
	Measurement	Planar Measurement	Repeatability	100x : 3σn-1=0.02μm、50x：3σn-1=0.04μm、20x：3σn-1=0.1μm
			Accuracy	Measurement Value ±2%
		Height Measurement	System	Revolving Nosepiece Vertical-Drive System
			Stroke	10mm
			Scale Resolution	0.8nm
			Movement Resolution	10nm
			Display Resolution	1nm
			Repeatability	100x :σn-1= 0.012μm、50x：σn-1＝0.012μm、20x：σn-1＝0.04μm
			Accuracy	0.2+L/100 μm or Less (L=Measuring Length)
	Color Observation Section	Light Source/Detector		Light Source: White LED, Detector: 1/1.8-Inch 2-Megapixel Single-Panel CCD
		Zoom		Digital Zoom: 1x – 8x
	Revolving Nosepiece			Motorized BF Sextuple Revolving Nosepiece
	Differential Interference Contrast Unit			Differential Interference Contrast Slider: U-DICR, Polarizing Plate Unit Built-In
	Objective Lens			BF Plan Semi-apochromat 5x, LEXT-Dedicated Plan Apochromat 20x, 50x, 100x
	Z Focusing Unit Stroke			76 mm
	XY Stage			100 x 100 mm (Motorized Stage)
SPM Section	Measurement mode			Contact mode, Dynamic mode, Phase mode, Current mode, Surface Potential (KFM) mode, Magnetic Force (MFM) mode*
	Displacement detection			Optical lever system
	Light source			659 nm Semiconductor Laser
	Detector			Photodetector
	Max. scanning range			X-Y: Max. 30μm x 30μm、Z: Max. 4.6μm
	Cantilever mount			One-touch mount using cassette-type cantilever holder. With the pre-alignment using the dedicated special tool for cantilever mounting, optical alignment is not required when replacing the cantilever
System	Total weight			Approx. 440 kg (excluding table)
	Input rating			100 - 120 V/220 - 240V, 600VA, 50/60 Hz

* Optional

Objective Lens

Model	Magnification	Field of View	Working Distance (WD)	Numerical Aperture (NA)
MPLFLN5X	108-864X	2,560-320μm	20.0mm	0.15
MPLAPON20XLEXT	432-3,456X	640-80μm	1.0mm	0.60
MPLAPON50XLEXT	1,080-8,640X	256-32μm	0.35mm	0.95
MPLAPON100XLEXT	2,160-17,280X	128-16μm	0.35mm	0.95

Cantilever

Application (Usage)	Product Name	Type	Chip Number	Cantilever		Probe		Material	Coating Metal
Application (Usage)	Product Name	Type	Chip Number	Resonance Frequency (kHz)	Spring Constant (N/m)	Height (μm)	Radius (nm)	Probe / Lever	Probe side / Reflex side
Dynamic mode/ Phase Mode	OMCL-AC160TS-C3	Standard silicon	24	300	26	14	7	Si / Si	Non / Al
Dynamic mode/ Phase Mode	OMCL-AC240TS-C3	Medium-soft silicon	24	70	2	14	7	Si / Si	Non / Al
Contact Mode	OMCL-TR800PSA-1	Standard silicon nitride	34	73 / 24	0.57 / 0.15	2.9	7	SiN / SiN	Non / Au
Surface potential mode	OMCL-AC240TM-B3	Silicon for electrical measurement	18	70	2	14	15	Si / Si	Pt/Al

• The dimensions and mechanical properties shown above are typical values.

• Pay special attention as cantilevers are very small and subject to danger of getting could get into your eyes or be accidentally ingested.
• For information on using cantilevers for Current mode and Magnetic Force mode, please contact your Olympus dealer.
• In addition to the cantilevers shown here, a wide variety of cantilevers are available from Olympus. Please contact your Olympus dealer for details.quest a Demo