CombiScope Scanner and Base 扫描器和基座
样品扫描范围:100 µm x 100 µm x 20 µm (±10 %); 可选 200 µm x 200 µm x 20 µm (± 10 %)
扫描类型:样品XY非线性 0.05 %; Z方向非线性 0.05 %
噪声:
0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on
0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off
< 0.1 nm RMS Z capacitance sensor in 1000 Hz bandwidth
X, Y, Z运动
Digital closed loop control for X, Y, Z axes
Motorized Z approach range 1.3 mm
Motorized XY head positioning 1.6 mm x 1.6 mm, 1 µm resolution
Sample size Maximum 50.8 mm x 50.8 mm, 5 mm thickness and up to 100 mm x 100 mm with special holder
Sample positioning range 25 mm x 25 mm
AFM 探头Head
Laser wavelength 1300 nm, non-interfering with spectroscopic detector
Registration system noise Down to < 0.03 nm
Alignment Fully automated cantilever and photodiode alignment
Probe access Free access to the probe for additional external manipulators and probes
SPM测量模式
Contact AFM in air/(liquid optional)
Conductive AFM (optional)
Nanolithography
Semicontact AFM in air/(liquid optional)
Magnetic Force Microscopy (MFM)
Nanomanipulation
Non -contact AFM
Kelvin Probe (Surface Potential Microscopy, SKM, KPFM)
STM (optional)
Phase imaging
Capacitance and Electric Force Microscopy (EFM)
Photocurrent Mapping (optional)
Lateral Force Microscopy (LFM
Force curve measurement
Volt-ampere characteristic measurements (optional)
Force Modulation
Piezo Response Force Microscopy (PFM)
Liquid Cell (optional)液体池(选项)
Fixing of Petri dish 35 mm
Sample positioning range 10 x 10 mm, 1 µm resolution
Volume of liquid: 3 ml
Capability of liquid exchange
Autoclave and ultrasonic cleaning of cell parts
Temperature Control for Liquid Cell (optional)液体池温控(可选)
Heating up to 60° C
Cooling below room temperature down to 5° C
Sample positioning range 5 x 5 mm
Positioning resolution 1 µm
Spectroscopy Modes光谱模式
共聚焦拉曼,荧光,发光成像和光谱Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy
针尖增强荧光Tip-Enhanced Fluorescence (TEFS)
针尖增强拉曼Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes
近场光扫描微光谱和光谱Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)
导电ARM单元Conductive AFM Unit (optional)
电流范围Current range
100 fA ~ 10 µA
3 current ranges (1 nA, 100 na and 10 µA) switchable from the software
可选附件和微光谱Optical Access and Microscope
Bottom optical access:Up to 1.49 NA oil immersion objective
Cloosed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment
Range 20 µm x 20 µm x 15 µm
Resolution: 1 nm
Inverted microscope:Research grade Nikon Ti-u, with optional Dark Field, DIC, Epi fluorescence and more
光谱仪Spectrometer
Fully automated XploRA INV compact inverted micro-spectrometer, functional as stand-alone micro-Raman microscope
Wavelength range 50 cm -1 to 4000 cm -1
Gratings 4 gratings on computer controlled turret (600, 1200, 1800 and 2400 g/mm)
Automation Fully motorized, software controlled operation
检测Detection
Full range of CCD detectors and EMCCDs
激光源Laser Sources
Typical wavelength 532 nm, 638 nm, 785 nm. Other wavelength available on request
自动化Automation
Fully automated laser and filter switching for up to 3 simultaneous lasers
Laser polarization selection and spectral analyzer options for all wavelengths
软件Software
Integrated software package including full featured SPM, spectrometer and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection and spectral search
functionalities.
经销商
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拉曼光谱仪
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