GOST R 8.698-2010
确保测量一致性的国家体系.纳米粒子和薄膜的空间参数.利用小角度X-射线散射衍射仪的测量方法
State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer