共找到 491 条与 其他半导体分立器件 相关的标准,共 33 页
Semiconductor die products - Part 1: Procurement and use
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Semiconductor die products - Part 7: XML schema for data exchange
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor die products - Part 8: EXPRESS model schema for data exchange
Semiconductor devices - Bias-temperature stability test for metal-ox ide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage
Discrete semiconductor devices and integrated circuits —Part 5-2: Optoelectronic devices — Essential ratings and characteristics
Discrete semiconductor devices and integrated circuits —Part 5-2: Optoelectronic devices — Essential ratings and characteristics
Discrete semiconductor devices and integrated circuits —Part 5-3: Optoelectronic devices — Measuring methods
Discrete semiconductor devices and integrated circuits —Part 5-3: Optoelectronic devices — Measuring methods
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013/A1:2020)
Semiconductor devices ― Micro-electromechanical devices ― Part 8: Strip bending test method for tensile property measurement of thin films
Semiconductor devices - MEMS devices - Part 5: RF MEMS switches
Semiconductor devices – Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Semiconductor devices. Magnetic and capacitive coupler for basic and reinforced insulation
Domaine d'applicationLa présente partie de l'IEC 60747 spécifie la terminologie, les valeurs assignées essentielles, les caractéristiques, l'essai de sécurité et les méthodes de mesure des coupleurs magnétiques et des coupleurs capacitifs.Elle spécifie les principes et exigences
Semiconductor devices - Part 17 : magnetic and capacitive coupler for basic and reinforced insulation
What is BS EN 60747-16-5 about? BS EN 60747 series covers semiconductor devices. BS EN 60747-16-5 is one of the parts of the documents that specify the terminology, essential ratings and characteristics, and measuring methods of microwave integrated circuit oscillators. BS EN 60747-16-5 is applicable to the fixed and voltage-controlled semiconductor microwave oscillator devices, except the oscillator modules such as synthesizers which require external controllers. Note: BS EN 60747-16-5 is not applicable to the quartz crystal-controlled oscillators. They are specified by IEC 60679-1 . Who is BS EN 60747-16-5 for?
Semiconductor devices - Microwave integrated circuits. Oscillators
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
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