L40/49 半导体分立器件 标准查询与下载
共找到 7 条与 半导体分立器件 相关的标准，共 1 页
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
- ICS
- 31.080.01
- CCS
- L40/49
- 发布
- 2021
- 实施
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
- ICS
- 31.080.01
- CCS
- L40/49
- 发布
- 2021
- 实施
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
- ICS
- 31.080.01
- CCS
- L40/49
- 发布
- 2021
- 实施
Semiconductor devices - Bias-temperature stability test for metal-ox ide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
- ICS
- 31.080.99
- CCS
- L40/49
- 发布
- 2021
- 实施
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
- ICS
- 31.020
- CCS
- L40/49
- 发布
- 2021
- 实施
本标准规定了免水洗分散黑色浆产品的要求、采样、试验方法、检验规则、应用工艺以及标志、标签、包装、运输和贮存。 本标准适用于免水洗分散黑色浆的产品质量及应用工艺控制,其他免水洗分散色浆产品可参照执行。
Wash-free disperse black pulp and its application technology
- ICS
- 59.080.20
- CCS
- L40/49
- 发布
- 2020-01-09
- 实施
- 2020-02-08
本标准规定了六氟化硫电气设备中六氟化硫气体纯度测量方法。 本标准适用于六氟化硫电气设备中六氟化硫气体纯度的测量，六氟化硫混合气体的纯度测量也可参考执行。
Measurement method of sulfur hexafluoride gas purity in sulfur hexafluoride electrical equipment
- ICS
- 29.020
- CCS
- L40/49
- 发布
- 2017-05-15
- 实施
- 2017-08-01
