L54 半导体光敏器件 标准查询与下载

GB/T 43063-2023 集成电路 CMOS图像传感器测试方法

Integrated circuit CMOS image sensor testing method

GB/T 18904.5-2003 半导体器件 第12-5部分;光电子器件 纤维光学系统或子系统用带/不带尾纤的pin光电二极管空白详细规范

本空白详细规范是半导体器件的一系列空白详细规范之一，并应与下列IEC标准一起使用。IEC 60747—10(Qc 700000)：1991 半导体器件 第l0部分分立器件和集成电路总规范IEC 60747—12(QC 720100)：1985半导体器件第l2部分光电子器件分规范

Semiconductor devices Part 12-5: Optoelectronic devices Blank detail specification for pin-photodiodeswith/without pigtail for fibre optic systems or subsystems

GB/T 18904.3-2002 半导体器件 第12-3部分;光电子器件 显示用发光二极管空白详细规范

本空白详细规范是半导体器件的一系列空白详细规范之一。

Semiconductor devices--Part 12-3: Optoelectronic devices--Blank detail specification for light-emitting diodes--Display application

GB/T 18904.4-2002 半导体器件 第12-4部分;光电子器件 纤维光学系统或子系统用带/不带尾纤的pin-FET模块空白详细规范

本空白详细规范是半导体器件的一系列空白详细规范之一。

Semiconductor devices-Part 12-4: Optoelectronic devices-Blank detail specification for pin-FET modules with/without pigtail for fiber optic systems or sub-systems

IEC 60747-5-6:2021 半导体设备. 第5-6部分: 光电设备. 发光二极管

This part of IEC 60747 specifies the terminology, the essential ratings and characteristics, the measuring methods and the quality evaluations of light emitting diodes (LEDs) for general industrial applications such as signals, controllers, sensors, etc. LEDs for lighting applica

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

NF C57-201*NF EN 50380:2017 光电模块的标记和文件要求

Marking and documentation requirements for photovoltaic modules

IEC 60747-5-7:2016 半导体设备. 第5-7部分: 光电设备. 光电二极管和光电晶体管

This part of IEC 60747 specifies the terminology, the essential ratings and characteristics as well as the measuring methods of photodiodes (hereinafter referred to as "PDs") and phototransistors (hereinafter referred to as "PTs").

Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors

IEC 60747-5-6:2016 半导体设备. 第5-6部分: 光电设备. 发光二极管

This part of IEC 60747 specifies the terminology, the essential ratings and characteristics, the measuring methods and the quality evaluations of light emitting diodes (LEDs) for general industrial applications such as signals, controllers, sensors, etc. LEDs for lighting applications are out of the scope of this part of IEC 60747. The types of LED are divided into the following five classes: a) LED package; b) LED flat illuminator; c) LED numeric display and alpha-numeric display; d) LED dot-matrix display; e) I LED (infrared-emitting diode). LEDs with a heat spreader or having a terminal geometry that performs the function of a heat spreader are within the scope of this part of IEC 60747. An integration of LEDs and controlgears, integrated LED modules, semi-integrated LED modules, integrated LED lamps or semi-integrated LED lamps, are out of the scope of this part of IEC 60747.

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

SJ/T 2216-2015 硅光电二极管技术规范

本规范规定了硅光电二极管的光电特性和机械特性以及环境特性的技术要求、检验方法和检验规则等。本规范适用于2CU系列硅光电二极管(以下简称“器件”)。

Technical specification for photodiode of silicon

SJ/T 2214-2015 半导体光电二极管和光电晶体管测试方法

本标准规定了半导体光电二极管和光电晶体管(以下简称“器件”)光电参数的测试方法。本标准适用于半导体光电二极管和光电晶体管光电参数的测试。本标准不适用PIN、雪崩光电二极管的测试。

Measuring methods for semiconductor photodiode and phototransistor

SJ/T 2354-2015 PIN、雪崩光电二极管测试方法

本标准规定了PIN、雪崩光电二极管(以下简称“二极管”)光电参数的测试方法。

Measuring methods for photodiodes of PIN、APD

SJ/T 2217-2014 硅光电晶体管技术规范

本规范规定了硅光电晶体管(以下简称“器件”)光电特性、机械特性和环境性能的技术要求、检验方法和检验规则。本规范适用于3DU系列硅光电晶体管。

Technical specification for phototransistor of silicon

IEC 61730-2:2012 光电(PV)模件安全合格鉴定.第2部分:检验要求

Photovoltaic (PV) module safety qualification - Part 2: Requirements for testing

JB/T 9479-2011 光敏电阻器总规范

本标准规定了光敏电阻器的术语和定义、分类与型号命名、要求、试验方法、检验规则、标志、包装、贮存和运输。 本标准适用于波长范围为380nm～3200nm的光敏电阻器。

Genenral specifications for photoresistors

KS C IEC 62124:2008 光电独立系统.设计检定

이 표준에 포함된 시방, 시험방법 및 절차는 독립형 태양광발전 시스템을 규정하는 것이다.

Photovoltaic(PV) stand-alone systems－Design verification

KS C IEC 61730-1:2008 光电(PV)模件安全合格鉴定.第1部分:施工要求

이 표준에는 태양광발전(photovoltaic:PV) 모듈의 예상 수명 동안 전기적 및 기

Photovoltaic(PV) module safety qualification-Part 1:Requirements for construction

KS C IEC 61730-2:2008 光电(PV)模件安全合格鉴定.第2部分:检验要求

이 표준은 태양광발전(photovoltaic:PV) 모듈의 예상 수명 동안 전기 작동 및

Photovoltaic(PV) module safety qualification-Part 2:Requirements for testing

ASTM E1036-08 使用标准电池的排列和非聚能地面光电模电气性能的标准试验方法

It is the intent of these procedures to provide recognized methods for testing and reporting the electrical performance of photovoltaic modules and arrays. The test results may be used for comparison of different modules or arrays among a group of similar items that might be encountered in testing a group of modules or arrays from a single source. They also may be used to compare diverse designs, such as products from different manufacturers. Repeated measurements of the same module or array may be used for the study of changes in device performance. Measurements may be made over a range of test conditions. The measurement data are numerically translated from the test conditions to standard RC, to nominal operating conditions, or to optional user-specified reporting conditions. Recommended RC are defined in Table 1. If the test conditions are such that the device temperature is within ±2°C of the RC temperature and the total irradiance is within ±5 % of the RC irradiance, the numerical translation consists of a correction to the measured device current based on the total irradiance during the I-V measurement. If the provision in 5.3.1 is not met, performance at RC is obtained from four separate I-V measurements at temperature and irradiance conditions that bracket the desired RC using a bilinear interpolation method. There are a variety of methods that may be used to bracket the temperature and irradiance. One method involves cooling the module under test below the reference temperature and making repeated measurements of the I-V characteristics as the module warms up. The irradiance of pulsed light sources may be adjusted by using neutral density mesh filters of varying transmittance. If the distance between the simulator and the test plane can be varied then this adjustment can be used to change the irradiance. In natural sunlight, the irradiance will change with the time of day or if the solar incidence angle is adjusted. These test methods are based on two requirements. First, the reference cell (or module, see 1.1.1 and 4.3.4) is selected so that its spectral response is considered to be close to the module or array to be tested. Second, the spectral response of a representative cell and the spectral distribution of the irradiance source must be known. The calibration constant of the reference cell is then corrected to account for the difference between the actual and the reference spectral irradiance distributions using the spectral mismatch parameter, which is defined in Test Method E 973. Terrestrial reference cells are calibrated with respect to a reference spectral irradiance distribution, for example, Tables G 173. A reference cell made and calibrated as described in 4.3 will indicate the total irradiance incident on a module or array whose spectral response is close to that of the reference cell. With the performance data determined in accordance with these test methods, it becomes possible to predict module or array performance from measurements under any test light source in terms of any reference spectral irradiance distribution. The reference conditions of 5.3.1 must be met if the measured I-V curve exhibits “kinks” or multiple inflection points. TABLE 1 Reporting Conditions Total Irradiance, Wm............

Standard Test Methods for Electrical Performance of Nonconcentrator Terrestrial Photovoltaic Modules and Arrays Using Reference Cells

KS C IEC 62093:2007 光电系统的系统平衡元部件.设计鉴定自然环境

이 규격은 지상에 설치된 태양광발전(PV)시스템에 사용되는 주변장치 부품의 설계검증에 대한

Balance-of-system components for photovoltaic systems－Design qualification natural environments

BS IEC 60747-5-4:2006 半导体器件.分立器件.光电器件.半导体激光器

This part of IEC 60747 deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.

Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers