X Ray Generator | Maximum Output Power | 600 W (option: 300 W) |
Output Stability | ≤25ppm/hr after a 2 hour warm up | |
Max Output Voltage | 40 kV (option: 30 kV) | |
Max Output Current | 15 mA (option: 10 mA) | |
Voltage Step Width | 0.1 kV | |
Current Step Width | 0.1 mA | |
Ripple | ≤1%rms at >20 kHz, 0.1%rms below 20 kHz | |
Preheat and Ramp | Automatic preheat and ramp control circuit | |
Input Voltage | 230 Vac +/-10%, 50 or 60 Hz, single phase | |
X-Ray Tube | Type | Glass (option: Ceramic), Cu Anode, Fine Focus (options: any kind of X-Ray tube) |
Focus | 0.4 x 8 mm LFF (other options available) | |
Max Output | 600 kW | |
Goniometer | Configurations | Vertical Theta/2Theta geometry |
Measuring circle diameters | 150 mm | |
Vertical Scanning Angular Range | - 5° < 2 Theta < + 145° (according to accessories) | |
Smallest selectable stepsize | 0.005° | |
Angular reproducibility | +/- 0.001° | |
Accuracy | +/- 0.01 | |
Modes of operation | Continuous scan, step scan, theta or 2 theta scan, fast scan | |
Variable Divergence slits | 0 - 4° | |
Variable Anti-Divergence slits | 0 - 4° | |
Variable Receiver slits | 0 - 4° | |
Soller slits | 2.3° | |
Detector | Type | Scintillation counter Nal (options: YAP(Ce); multistrip) |
Count rate | 10(5) cps (Nal); 2 x 10(7) cps (Yap(Ce)) | |
Case | Dimensions | Width 600 mm, heigh 750 mm, depth 500 mm |
Weight | 130 kg | |
Leakage X-rays | < 1 mSv/Year (full safety shielding according to the international guidelines) | |
Processing Unit | Computer Type | Personal Computer, the latest version |
Items controlled | X-ray generator, goniometer, sample holder, detector | |
Basic Data Processing | Polynomial least squares smoothing. Fourier smoothing. Search for Peaks (automatic and manual). Spline background subtraction. Single peak analysis (area, FWHM, centroid, background). Marquardt fit (with pseudo-Voigt and Pearson VII curves, Ka2 contribution, weighted sum of squares). Sum and multiply by a constant. Scale normalization. Zoom. Graphical windows. Overlap and comparison of diffractograms. Multiview function. Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples. Qualitative and quantitative phase analysis. Rietveld analysis, crystalline structural analysis, crystallite size and lattice strain, crystallinity calculation |
请扫描二维码查看详细参数
经销商
除厂家/中国总经销商外,我们找不到 EUROPE 台式X射线衍射仪 的一般经销商信息,有可能该产品在中国没有其它经销商。
如果您是,请告诉我们,我们的邮件地址是:sales@antpedia.net 请说明: 1.产品名称 2.公司介绍 3.联系方式 |
X射线衍射仪(XRD)
售后服务
我会维修/培训/做方法
如果您是一名工程师或者专业维修科学 仪器的服务商,都可参与登记,我们的平台 会为您的服务精确的定位并展示。