The C-Swift detector sets a new standard when speed is key:
Guaranteed indexing speeds of 1000 pps using only 12 nA beam current
156 x 128 pixel pattern resolution at maximum speed – 4 times more pixels than a fast CCD detector at comparable speeds
Full resolution (622 x 512) patterns – ideal for detailed phase and deformation analyses
Low distortion optics, ensuring an angular precision better than 0.05°.
High sensitivity with an optimised phosphor screen, ensuring high quality patterns at low doses and low beam energies – resulting in maximum spatial resolution
Seamless EDS integration even at the highest speeds
Bellows SEM interface, maintaining the microscope’s vacuum integrity
Unique proximity sensor – detects potential collisions before they happen and automatically moves the detector to a safe position
Simple and intuitive detector settings, ensuring optimum results every time
Five integrated forescatter detectors, providing full colour complementary channelling contrast and atomic number contrast images.
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