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您现在所在的位置:首页 >> 仪器导购 >> 光学位移台>> MCL 测量 纳米计

MCL 测量 纳米计

tel: 400-6699-117 3355

MCL光学位移台, 本产品操作简单,使用便捷。

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技术特点

【技术特点】-- MCL 测量 纳米计

 

Product Description

The Nano-Gauge™ is an ultra high precision, single axis, displacement measuring instrument capable of resolving dimensions down to 1.5 nanometers (0.06 microinches) over a full scale range of 25mm (1 inch). Combining ease-of-use and small physical size, the Nano-Gauge™ can be quickly adapted to a wide variety of precision measurement situations without lengthy or complex setup procedures. A standard USB “Plug& Play” digital interface connects the Nano-Gauge™ controller to a PC for a real-time display of measurement values. Laptop PC’s with USB ports can be used to bring the Nano-Gauge™ into the field for on-site measurements. An on-screen zeroing button provides a simple means to accomplish relative measurements and makes the Nano-Gauge™ as easy to use as standard machinist’s digital calipers. A displayed “up/down” measurement rate selector determines the data acquisition time spacing. Measurement rates range from 50 ms/data value to 1 minute/data value. Available probe tips include hardened steel, sapphire, and silicon nitride balls. Probes can also be provided with threaded holes for direct connection to moving components or customized for specific applications. The pictured Nano-Gauge™ mounting is designed to fit standard optical table breadboards - custom mounting for unique applications may be specified. Probe tip loading is user adjustable via internal springs. Probe loading may be eliminated by use of magnetically coupled steel tipped probes. The extreme precision and resolution of the Nano-Gauge™ makes it ideal for transducer design and calibration, development of nanoindentation systems, and materials testing.





Additional Information

Nano-Gauge™ Series  Drawing

Nano-Gauge™ Series Catalog Pages




【技术特点对用户带来的好处】-- MCL 测量 纳米计


【典型应用举例】-- MCL 测量 纳米计



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