高分辨率飞行时间气溶胶质谱仪 ( HToF-AMS )

技术指标

可选部件：

1. 气溶胶光散射检测模块：光散射检测模块提供粒径 >200nm 粒子的相关参数，如粒子密度和气溶胶粒子混合状态（内混/外混）。此模块可以安装于四极杆气溶胶质谱仪和飞行时间气溶胶质谱仪；当与飞行时间气溶胶质谱仪结合使用时，可以真正测量到单个气溶胶的质谱。

2. 黑碳检测模块：黑碳检测模块由本公司与粒子测量公司（Droplet Measurement Technologies）联合开发。模块采用连续工作的1064nm 内腔激光器。含有黑碳的粒子（或者其它可吸收物质）会在 AMS 的离子化室内汽化。除了标准AMS 所测量的组分外，还可以检测碳簇（包括富勒烯）。此模块兼容所有型号的 AMS，即为SP-AMS。

3. 负离子测量模块（飞行时间质谱）：负离子检测模块选择性地检测稳定的负离子，如硫酸盐、硝酸盐、羧酸等。灵敏度相比电子碰撞电离低1000。此模块通过控制软件可与标准的电子 撞击电离模块交互使用，并可用于其它产生负离子的电离系统。此模块只兼容ToF 质谱系统。

4. 以上部件可以安装在现有的气溶胶质谱仪上，但总体目标是增强粒径、化学组成和气溶胶粒子密度的快速实时测量能力。

5. 热力熔蚀系统(TDS)：热力熔蚀系统可以辅助检测挥发性有机气溶胶。热力熔蚀系统只对气溶胶样品进行前处理，可用于所有型号的AMS 自动采样系统和其它气溶胶采样系统。该部件可以独立运行，与其它测量仪器联用。

6. 二次颗粒物氧化生成反应器(PAM)：二次颗粒物氧化生成反应器通过准确控制温度、相对湿度、氧化剂浓度与相互比例等参数，在反应腔内产生一个已知的高氧化环境，能够以分钟为时间分辨率模拟大气环境中气体前体物生成的氧化过程。该设备还能够与许多气溶胶观测设备搭配使用，是一次气溶胶非均相氧化研究与二次气溶胶生成研究的重要工具。

Two versions of the Aerodyne AMS are available. The Compact Time-of-Flight AMS (C-ToF-AMS) incorporates a high-performance, compact time-of-flight mass spectrometer and enables continuous monitoring of the mass spectra (1-800 m/z) of all sampled particles at rates as fast as 80 kHz.  The detection limit for the C-ToF-AMS is the lowest of the two versions. The High-Resolution ToF AMS (HR-ToF-AMS) also enables continuous acquisition of complete mass spectra of individual particles, and enables the resolution of distinct chemical species based on mass defect.  Algorithms are being developed which allow elemental analysis of HR-ToF-AMS data. The properties of the two versions are summarized in the following table.

Coming soon - CC-ToF-AMS

检出限：

C-ToF-AMS： 0.002 ug/m3

HR-ToF-AMS (V-mode，单次反射模式）：0.003 ug/m3

HR-ToF-AMS (W-mode，双反射模式）：0.05 ug/m3

分辨率：

C-ToF-AMS： 800

HR-ToF-AMS (V-mode，单次反射模式）：2000

HR-ToF-AMS (W-mode，双反射模式）：4000

m/z范围：

C-ToF-AMS： 1-800

HR-ToF-AMS (V-mode，单次反射模式）：1-1200

HR-ToF-AMS (W-mode，双反射模式）：1-1200

物理尺寸：

• Size: Approximately 41“W x 24“D x 53“H

• Weight: Approximately 170 kg

• Power: Approximately 600 Watts. Universal power 110VAC/60Hz or 220VAC/50Hz. Vacuum system fully operational on 24 VDC.

• Computer: Current systems are shipped with rack a mounted computer, PIII 3GHz, Intel CoreTM 2 Duo Processor, 512M SDRAM, 160G hard drive, CD-RW, floppy, 10/100 Ethernet port, 8 USB ports, 1 serial port. Flat screen monitor 15” XGA.

• Packaging: Shipped in one reusable container. Total shipping weight ~280 kg.

AMS选项：

Light Scattering Module provides additional information for larger particles (>200nm), particularly for large refractory (dust) particles with low non-refractory coatings. Light scattering analysis also can provide information on particle density and distinguish internal/external mixtures.

Negative Ion Detection Option for ToF-AMS (via electron attachment) selectively detects stable anion species, such as sulfate, nitrate and carboxylic acids. Sensitivity is 1000 lower than electron impact (EI). Switchable with standard EI.M

Relative Humidity/Temperature/Pressure probes allow the user to measure ambient relative humidity, temperature and pressure at sampling inlet, with all measurements fully integrated into the data acquisition system.

Beam Width Probe allows measurement of particle shape by measuring the divergence of the particle beam.

Service/Support Contract (3 years) includes spare parts (extra filaments and electron multiplier) and up to two weeks of on-site support. Parts and support are interchangeable, as needed, based on advance payment of fee. Parts will usually be shipped overnight.