技术特点
【技术特点】-- Allied基材厚度测量仪 X-PREP® VISION™
The X-Prep® fixture adapter is also secured to the motorized stage on the X-Prep® Vision™, ensuring the measurement/tool control coordinates remain aligned when transferred between systems.
A library with over 130 materials (i.e., GaAs, InGaAs, SiC, Sapphire/Al2O3, InP, SiGe, GaN, photo-resist) is included with every system.
Meaurement & Observation - How it Works
IR light is focused onto a sample, and a unique signal based on the refractive index of the material is created. The return signal is analyzed by the software to produce a thickness value.
Meauring Below 10 μm Thickness
For applications requiring thinning to less than 10 μm, precise measurement is possible only by adding the visible light spectrometer accessory.
【技术特点对用户带来的好处】-- Allied基材厚度测量仪 X-PREP® VISION™
【典型应用举例】-- Allied基材厚度测量仪 X-PREP® VISION™
售后服务
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