I:Standard model标准模式, II:Map model地图式模式, III:Montage model蒙太奇模式, IV:Particle analysis model颗粒分析模式, V:Large area particle analysis model大面积颗粒分析模式
●Built in, ○Optional
| 機能 | I | II | III | IV | V | Note | |
|---|---|---|---|---|---|---|---|
| OS | OS Microsoft® Windows® XP or later version Multi user compatible | ||||||
| Operation menu | English | ||||||
| Detector | Select one from the list below | Multi user compatible | |||||
| EDS spectral analysis | Qualitative analysis/Quantitative analysis (ZAF, Thin film) | ● | ● | ● | ● | ● | |
| Visual Peak ID (VID) | ● | ● | ● | ● | ● | ||
| Thin film analysis | ● | ● | ● | ● | ● | ||
| Chemical type classification, Q base (Spectral matching) | ● | ● | ● | ● | ● | ||
| Count rate & Dead time real time display | ● | ● | ● | ● | ● | ||
| Report generation | One click report | ● | ● | ● | ● | ● | |
| SMile View™ | ● | ● | ● | ● | ● | ||
| Exporting to Microsoft® Word、PowerPoint® | ● | ● | ● | ● | ● | ||
| Integration | Automatic monitoring of microscope conditions (Magnification, accelerating voltage, and specimen stage position) | ● | ● | ● | ● | ● | 1 |
| SEM WD monitoring | ● | ● | ● | ● | 2 | ||
| Analysis initiated on SEM GUI (Set analysis position on SEM monitor) | ● | ● | ● | ● | 2 | ||
| Analysis Assist | The analysis condition is set in the wizard form | ● | ● | ● | ● | ||
| Analysis Station | Analysis initiated on EDS monitor (Analysis position set on the SEM image on EDS monitor) | ● | ● | ● | ● | ||
| Line analysis | Line analysis, Quantitative line analysis Active map line | ● | ● | ● | ● | ||
| Elemental map | Elemental map (Active map, Map with 3 colors, Probe tracking) | ● | ● | ● | ● | ||
| High-definition image (4096 3072pixels for SEM/TEM/Elemental map) | ● | ● | ● | ● | |||
| Pop up spectrum | ● | ● | ● | ● | |||
| Quantitative map | ● | ● | ● | ● | |||
| Residual map | ● | ● | ● | ● | |||
| Elemental map on multiple areas | Graphic display of analysis positions, Navigation, Auto sequential analysis, Pin-point navi, Data archiving | ● | ● | ● | 3 | ||
| Automatic sequential analysis on multiple areas | Auto montage (SEM image, elemental map) | ● | ● | 3 | |||
| Automatic acquisition of elemental maps on multiple areas | ● | ● | 3 | ||||
| Particle Analysis Software | Particle Analysis and EDS analysis (Auto/manual) | ● | ● | ||||
| Statistical analysis (Results, particle diameter, area, etc) | ● | ● | |||||
| Sequential particle & EDS analysis on multiple areas | ● | 4 | |||||
| Particle Finder | ● | 4 | |||||
| Manual review | ● | 4 | |||||
| GSR analysis | Automatic Gun shot residue analysis (Specimen for GSR) | ● | 4、5 | ||||
| PHI-RHO-Z quantitative analysis | Improved quantitative analysis of light elements | ○ | ○ | ○ | ○ | ○ | |
| Probe current compensation | Monitoring of probe current, compensation for probe current fluctuation | ○ | ○ | ○ | ○ | ○ | 6 |
| Acquisition of user standard | ○ | ○ | ○ | ○ | ○ | 6 | |
| Swing mouse | One set of mouse & keyboard control 2 PCs (SEM & EDS) | ○ | ○ | ○ | ○ | ○ | 7 |
| Phase analysis | Automatic phase analysis | ○ | ○ | ○ | ○ | ||
| Off line data analysis | Licence software for off line data analysis | ○ | ○ | ○ | ○ | ○ | |
Possible when EDS is linked to microscope PC.
Applicable to JCM-5700 & JSM-6X10A/LA
Applicable to SEM with motorized stage
Applicable to SEM with X, Y, Z motorized control
Optional GSR unit is required.
Optional Probe current compensation unit is required. Probe current monitoring is possible when EDS is linked to microscope PC. JSM-7001F/7500F/7600F do not require this unit.
JCM-5700 and JSM-6X10A/LA do not require. Items with T is specification of.8 JED-2300T.
Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.
1. X 射线能谱分析仪技术规格:
*1.1 探测器类型：电制冷型探测器,探头需采用无窗可
伸缩型设计，无窗探测器具有超高灵敏度，适合轻元
素测量
1.2 能量分辨率：优于 133eV
1.3 元素分析范围：4B 至 92U
*1.4 探测器总面积：≥100mm2
1.5 固体角：≥0.95sr
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