NanoWizard 4 NanoScience纳米科学原子力显微镜

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces the latest in their series of world-leading AFM systems, the NanoWizard® 4 NanoScience AFM.

JPK is pleased to announce their latest AFM system, the world’s most flexible AFM: the NanoWizard® 4 NanoScience AFM. JPK continues to provide nano solutions for science. The new NanoScience system again raises the bar interms of technical performance to deliver exciting new capabilities for users. It features a powerful fast scanning option delivering images every three seconds enabling users to track dynamic processes. Additionally, with the unique QI™ mode, quantitative imaging is possible with outstanding high resolution.

JPK has focused on providing users with an easy, intuitive imaging capability with more modes and accessories than any other AFM system. Specifically, the NanoWizard® 4 NanoScience AFM provides unique solutions for mechanical and electrical sample characterization delivering flexible, advanced research capabilities to address the increasingly complex challenges faced by materials scientists today. The system employs the powerful digital Vortis™controller to enable atomic resolution and fast scanning capabilities on a single platform. JPK’s QI™ mode (based on real force curves) gives the user unmatched force sensitivity and control to be able to handle any brittle, delicate, soft or sticky sample. The proven Ultra Speed scanner technology delivers three seconds per image performance for a 100 x 100 micron image area, performance that is thirty times faster than other AFMs with such a large scan range.

With the demand for increasing productivity and with more users wishing to perform long-running experiments over prolonged periods yet still being “in contact” with them, JPK has added expanded usability and remote experimental control. The new ExperimentControl™ feature enables the user to both set up and control experiments via the Internet using their PC, tablet or smart phone. This delivers real time data allowing users to be in touch with their AFM 24/7!

The newly developed CryoStage option enables the user to control sample temperature from -120°C up to 200°C differentiating performance from regular ambient AFM systems. Additionally, the new StretchingStage can apply an external mechanical load to the sample, while the AFM measures variation of the sample properties in-situ. Furthermore, modules and modes for electrical measurements such as Conductive AFM (CAFM), Electrical Force Microscopy (EFM) and Kelvin Probe AFM (KPM-AFM) have been enhanced.

With the nano sciences constantly demanding higher performance, the NanoWizard® platform from JPK delivers a unique AFM system that has grown to meet these demands. NanoWizard® 4 NanoScience AFM is the latest solution and is designed to answer the advanced and complex questions of tomorrow’s research delivered TODAY.

JPK 仪器, 世界领先的 nanoanalytic 仪器的生命科学和软物质的研究的制造商, 宣布zei新的系列世界领先的 afm 系统, NanoWizard®4纳米 AFM。

JPK 很高兴地宣布他们zei新的 afm 系统, 世界上zei灵活的 AFM: NanoWizard®4纳米 AFM。JPK 继续为科学提供纳米解决方案。新的纳米系统再次提高技术性能的门槛, 为用户提供了令人振奋的新功能。它具有强大的快速扫描选项, 每3秒提供一次图像, 使用户能够跟踪动态进程。此外，独特的 QI™模式可进行高分辨率的定量成像。

JPK 的重点是为用户提供一个简单, 直观的成像能力, 更多的模式和配件比任何其他 AFM 系统。具体而言, NanoWizard®4纳米 AFM 为机械和电气样品的特性提供了独特的解决方案, 为解决材料所面临的日益复杂的挑战提出了灵活、先进的研究能力今天是科学家该系统采用强大的数字 Vortis™controller, 在单个平台上实现了原子分辨率和快速扫描功能。JPK 的 QI™模式 (基于实际力曲线) 给用户无与伦比的力量灵敏度和控制, 能够处理任何脆, 细腻, 软或粘性样品。经过验证的超高速扫描仪技术为 100 x 100 微米的图像区域提供了三秒的每个映像性能, 其性能比其他具有如此大扫描范围的 AFMs 快三十倍。

随着对提高生产率的需求, 以及更多的用户希望长期进行长时间的实验, 但仍与他们保持 “联系“, JPK 增加了可用性和远程实验控制。新的 ExperimentControl™功能, 使用户既可以设置和控制实验通过互联网使用他们的 PC, 平板电脑或智能手机。这提供了实时数据, 允许用户与他们的 AFM 24/7 接触!

新开发的 CryoStage 选项使用户能够控制样品温度从-120 到200° c 的区分性能与常规环境 AFM 系统。此外, 新的 StretchingStage 可以应用外部机械负荷的样品, 而 AFM 测量的变化, 样品的性质原位。此外, 电子测量的模块和模式, 如导电 afm (CAFM), 电力显微镜 (EFM) 和开尔文探针 afm (KPM afm) 已得到加强。

随着纳米科学不断要求更高的性能, NanoWizard®平台从 JPK 提供了一个独特的 AFM 系统, 已成长, 以满足这些要求。NanoWizard®4纳米 AFM 是zei新的解决方案, 旨在回答今天的研究提出的先进和复杂的问题。