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详细谈谈:赛默飞电镜的前世今生

2023.1.09

  Apero2的设计特点

  1. T1探测器的设计

  如何避免非导电样品的荷电效应一直是高分辨成像的难题,高分子和生物类样品,还容易受到电子束的损伤。常规喷金手段所使用的黄金和白金靶材,其颗粒都会掩盖纳米颗粒的细节。利用背散射探测器可以抑制荷电效应,但传统的半导体探测器有能量阈值的限制,在小于2kev加速能量时,几乎采集不到信号。而T1探测器不存在能量阈值,且设计在极靴附近的位置,充分利用背散射电子空间发射的特点,在低电压和低束流下也拥有非常好的信噪比,在材料科学与生命科学领域,有着优异的成像表现。

图112.jpg

图12 (左图)氧化铝增强氧化锆陶(右图)溶菌酶-纳米银复合材料,黄色圆圈位置,可见尺寸约5nm左右银颗粒

  2. 工作距离WD10mm下的高分辨成像

  能谱采集和高分辨成像的条件是相互冲突,很多时候,不能在高分辨的模式(比如WD=4mm)下兼顾能谱仪的采集计数率。在实际操作时,往往也会碰到很多高度不统一的样品,过短的WD存在碰撞极靴的风险,大工作距离的高分辨成像就变的有实际意义。如图13所示,即使在WD=10mm情况下,依旧轻松上到10万倍(底片),1KV下依旧能观察到磁性粉末表面的纳米颗粒细节。

  3. 免费的大面积拼图软件

  大面积拼图软件的好处不必多说,从成像策略角度看,相当于锦上添花。

图113.jpg

图13 (左图) 磁性粉末样品,WD=4mm, 100Kx(右图) 磁性粉末样品,WD=10mm, 100Kx

图114.jpg

图14 Apero2的探测器位置设计及其成像特点

  在产品的更新迭代上,赛默飞电镜一直传承了飞利浦和FEI的高性能与用户体验兼顾的设计理念,发布了多款在业内有口皆碑的设备。如今,Thermo Scientific拥有电子显微镜市场的最大市场份额,在各行各业提供最全面、最优异的各类电子显微镜产品。

  参考资料:

  1. Earnshaw, Aliza, "FEI Puts Market Ahead of Products in Culture Change," Portland Business Journal, October 17, 2005.

  2. "FEI's Strategy for Reaching Big Leagues," Portland Business Journal, August 18, 2003.

  3. Fasca, Chad, "FEI, Micrion to Merge," Electronic News, December 7, 1998, p. 4.

  4. Graham, Jed, "FEI Emerges As Defect Hunter," Investor's Business Daily, May 1, 2001, p. A04.

  5. McIntyre, Jo, "FEI Is One of the Eyes of the Nan Science and Business Boom," smalltimes, http://www.smalltimes.com/document_display.cfm?document_id=6949, November 17, 2003.

  6. Opdyke, Jeff D., "FEI CO. Is Moving Out of the Land and into New Growth Prospects," Wall Street Journal, January 13, 1999, p. NW2.

  7. Pointer, Starla, "A Lead in His Field," News-Register (McMinnville, Ore.), May 14, 2005.

  8. Saarinen, Yvette, "Field Emissions Research Finds a Home in Mac," News-Register (McMinnville, Ore.), November 4, 2000.

  9. H. Orloff, L.W. Swanson & M.W. Utlaut, High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology, 2003 Edition, Springer, 2003,

  10. "Thermo Fisher Scientific Completes Acquisition of FEI Company" Press Release, 19-09-2016, thermofisher.com. Retrieved 20 December 2016.

  11. Hawkes P. A souvenir of Philips electron microscopes[J]. 2001.

  12. Le Poole J B. Early electron microscopy in the Netherlands[M]//The Beginnings of Electron Microscopy. Academic Press Orlando, 1985, 16: 387-416.

  13. Van Iterson W. 2.10 Electron Microscopy in the Netherlands: 2.10 A Earliest Developments[M]//Advances in Imaging and Electron Physics. Elsevier, 1996, 96: 271-285

  14. 章效锋. 显微传:清晰的纳米世界[M]. 清华大学出版社, 2015.

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