IEC 62321-4:2013/AMD1:2017
电工制品中特定物质的测定.第4部分:通过CV-AAS,CV-AFS,ICP-OES和ICP-MS法测定聚合物, 金属和电子中的汞.修改件1
Determination of certain substances in electrotechnical products - Part 4: Mercury in polymers, metals and electronics by CV-AAS, CV-AFS, ICP-OES and ICP-MS; Amendment 1