ASTM E983-2005
俄歇电子光谱仪中干扰电子束效应最小化的标准指南

Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy

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标准号

ASTM E983-2005

发布日期

2005年

实施日期

废止日期

无

中国标准分类号

N51

国际标准分类号

17.180.30 (Optical measuring instruments)

发布单位

US-ASTM

适用范围

1.1 This guide outlines the origins and manifestations of unwanted electron beam effects in Auger electron spectroscopy (AES).

1.2 Some general guidelines are provided concerning the electron beam parameters which are most likely to produce these effects and suggestions are offered on how to minimize them.

1.3 General classes of materials are identified which are most likely to exhibit unwanted electron beam effects. In addition, a tabulation of some specific materials which have been observed to undergo electron damage effects is provided.

1.4 A simple method is outlined for establishing the existence and extent of these effects during routine AES analysis.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ASTM E983-2005 中可能用到的仪器设备