EN 60749-30-2005 半导体器件.机械和气候试验方法.第30部分:可靠性试验之前不气密的表面安装器件的预调试 IEC 60749-30-2005
Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Incorporates Amendment A1: 2011)