A43 化学 标准查询与下载

ASTM E1504-06 次级离子质谱法(SIMS)中质谱数据报告的标准实施规程

This practice is intended for use in reporting the experimental and data reduction procedures described in other publications.1.1 This practice provides the minimum information necessary to describe the instrumental, experimental, and data reduction procedures used in acquiring and reporting secondary ion mass spectrometry (SIMS) mass spectral data.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)

ASTM E168-06 红外线定量分析的一般技术的标准操作规程

These practices are intended for all infrared spectroscopists. For novices, these practices will serve as an overview of preparation, operation, and calculation techniques. For experienced persons, these practices will serve as a review when seldom-used techniques are needed.1.1 These practices cover the techniques most often used in infrared quantitative analysis. Practices associated with the collection and analysis of data on a computer are included as well as practices that do not use a computer.1.2 This practice does not purport to address all of the concerns associated with developing a new quantitative method. It is the responsibility of the developer to ensure that the results of the method fall in the desired range of precision and bias.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific hazard statements appear in Section and Note 0, Note 0, and Note 0.

Standard Practices for General Techniques of Infrared Quantitative Analysis

ASTM E1635-06 报告次级离子质谱法(SIMS)成像数据用标准实施规程

This practice is to be used for reporting the experimental and data reduction procedures to be described with the publication of the data.1.1 This practice lists the minimum information necessary to describe the instrumental, experimental, and data reduction procedures used in acquiring and reporting images generated by secondary ion mass spectrometry (SIMS).1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)

ASTM E984-06 用俄歇电子能谱法鉴别化学效应和基体效应用标准指南

Auger electron spectroscopy is often capable of yielding information concerning the chemical and physical environment of atoms in the near-surface region of a solid as well as giving elemental and quantitative information. This information is manifested as changes in the observed Auger electron spectrum for a particular element in the specimen under study compared to the Auger spectrum produced by the same element when it is in some reference form. The differences in the two spectra are said to be due to a chemical effect or a matrix effect. Despite sometimes making elemental identification and quantitative measurements more difficult, these effects in the Auger spectrum are considered valuable tools for characterizing the environment of the near-surface atoms in a solid.1.1 This guide outlines the types of chemical effects and matrix effects which are observed in Auger electron spectroscopy.1.2 Guidelines are given for the reporting of chemical and matrix effects in Auger spectra.1.3 Guidelines are given for utilizing Auger chemical effects for identification or characterization.1.4 This guide is applicable to both electron excited and X-ray excited Auger electron spectroscopy.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy

KS A 0511-2005 温度测定方法通则

이 규격은 온도를 측정하는 일반적 방법에 대하여 규정한다.

Temperature measurement－General requirement

KS A 0515-2005 涡轮流量计计量法

이 규격은 터빈 유량계(이하 유량계라 한다.)를 이용하여 관 내에 가득차서 흐르는 액체의

Method of flow measurement by turbine meters

KS A 0514-2005 压力式温度计及双金属温度计测定法

이 규격은 충만식 온도계 및 바이메탈식 온도계(이하 온도계라 한다.)로 온도를 측정할 때의

Method of temperature measurement by filled-system thermometers and bimetaillic thermometers

JIS K 0120:2005 荧光分析的一般规则

この規格は，蛍光光度分析装置を用いて，紫外可視から近赤外領域における蛍光強度を測定し，これによって物質の定性及び定量分析を行う場合の通則について規定する。ただし，原子蛍光及び蛍光X線を用いる方法には適用しない。

General rules for fluorometric analysis

JIS K 0148 ERRATUM 1:2005 勘误

ERRATUM

ISO 16962:2005 表面化学分析.用辉光放电光发射光谱测定法分析锌和/或铝基金属涂层

This International Standard specifies a glow discharge optical emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metallic surface coatings consisting of zinc- and/or aluminium-based materials. The alloying elements considered are nickel, iron, silicon, lead and antimony. This method is applicable to zinc contents between 0,01 mass % and 100 mass %; aluminium contents between 0,01 mass % and 100 mass %; nickel contents between 0,01 mass % and 20 mass %; iron contents between 0,01 mass % and 20 mass %; silicon contents between 0,01 mass % and 10 mass %; lead contents between 0,005 mass % and 2 mass %; antimony contents between 0,005 mass % and 2 mass %.

Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry

JIS K 0148:2005 表面化学分析.用总反射X-射线荧光(TXRF)测定法测定硅晶片的表面主要污染物

この規格は，シリコン鏡面ウェーハ又はエピタキシャルウェーハの表面原子濃度を，全反射蛍光X線分折法(TXRF)によって定量する方法について規定する。 この方法は，次の元素分析に適用する。—原子番号が16(S)から92(U)までの元素 —表面原子濃度が1 × 10 atoms/cmから1 × 10 atoms/cmまでの汚染元素 —VPD試料前処理法を用いる場合は，表面原子濃度が5 × 10 atoms/cmから5 × 10 atoms/cmまでの汚染元素

Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

ASTM E1217-05 用X射线光电子光谱仪和俄歇电子光谱仪测定影响检测信号的样品面积的标准实施规范

1.1 This practice describes methods for determining the specimen area contributing to the detected signal in Auger electron spectrometers and some types of X-ray photoelectron spectrometers when this area is defined by the electron collection lens and aperture system of the electron energy analyzer. The practice is applicable only to those X-ray photoelectron spectrometers in which the specimen area excited by the incident X-ray beam is larger than the specimen area viewed by the analyzer, in which the photoelectrons travel in a field-free region from the specimen to the analyzer entrance, and in which an auxiliary electron gun can be mounted to produce an electron beam of variable energy on the specimen.1.2 This practice is recommended as a useful means for determining the specimen area viewed by the analyzer for different conditions of spectrometer operation, for verifying adequate specimen and beam alignment, and for characterizing the imaging properties of the electron energy analyzer.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

ASTM E131-05 与分子光谱学的相关标准术语

Standard Terminology Relating to Molecular Spectroscopy

ASTM D4936-05 用还原/滴定法对硫基苯并噻唑亚磺酰胺鉴定的标准试验方法

This test method is designed to assess the purity of 2-mercaptobenzothiazole sulfenamide accelerators. These products are used in combination with sulfur for the vulcanization of rubber. The test method is suitable for assessing product specifications in that the property it measures is related to product performance. Since it is the primary property for comparison of product quality at different production facilities, good interlaboratory accuracy and precision is required. Based on past experience, two significant sources of error in this test method are: (1) incomplete reduction and (2) titration end point assessment. Problems in these areas can be avoided by closely following the procedure.1.1 This test method covers the determination of assay on mercaptobenzothiazole (MBT) sulfenamides. It is based on a titration of the basic amines liberated upon reduction of the sulfenamides with hydrogen sulfide gas (H2S), or 2-mercaptobenzothiazole.1.2 Any free amine (HNR2) or weak acid salts of the corresponding amine (HXHNR2) are titrated prior to reduction. This titer is used to calculate percent basic impurity (as free amine) in the sample.1.3 With the indicated modifications, this test method is applicable to all MBT sulfenamides, that is, N-cyclohexyl-2-benzothiazolesulfenamide (CBS), N,N-diisopropyl-2-benzothiazyl sulfenamide (DIBS), 2 (morpholinothio) benzothiazole (MBS), N,N-dicylohexyl-2-benzothiazyl sulfenamide (DCBS), N-tert-butyl-benzothiazole-sulfenamide (TBBS), and 4-morpholinyl-2-benzothiazyl disulfide (MBSS).1.4 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific hazard statements, see Section .

Standard Test Method for Mercaptobenzothiazole Sulfenamide Assay by Reduction/Titration

ASTM E135-05a 金属、矿石及相关材料的分析化学的相关标准术语

1.1 This is a compilation of terms commonly used in analytical chemistry for metals, ores, and related materials. Terms that are generally understood or defined adequately in other readily available sources are either not included or their sources are identified.1.2 A definition is a single sentence with additional information included in a Discussion.1.3 Definitions identical to those published by another standards organization or ASTM committee are identified with the name of the organization or the identifying document and ASTM committee.1.4 Definitions specific to a particular field (such as emission spectrometry) are identified with an italicized introductory phrase.

Standard Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials

ASTM E135-05 金属、矿石及相关材料的分析化学的相关标准术语

1.1 This is a compilation of terms commonly used in analytical chemistry for metals, ores, and related materials. Terms that are generally understood or defined adequately in other readily available sources are either not included or their sources are identified.1.2 A definition is a single sentence with additional information included in a Discussion.1.3 Definitions identical to those published by another standards organization or ASTM committee are identified with the name of the organization or the identifying document and ASTM committee.1.4 Definitions specific to a particular field (such as emission spectrometry) are identified with an italicized introductory phrase.

Standard Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials

ASTM E1621-05 X射线发散光谱分析标准指南

X-ray fluorescence spectrometry can provide an accurate and precise determination of metallic and many non-metallic elements. This guide covers the information that should be included in an X-ray spectrometric analytical method and provides direction to the analyst for determining the optimum conditions needed to achieve acceptable accuracy. The accuracy of an analysis is a function of the calibration scheme, the sample preparation, and the sample homogeneity. Close attention to all aspects of these areas is necessary to achieve the best results. 1.1 This guide covers guidelines for developing and describing analytical procedures using a wavelength-dispersive X-ray spectrometer.1.2 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for X-Ray Emission Spectrometric Analysis

BS EN ISO 16664:2008 气体分析.校准气体和气体混合物的操作.指南

This International Standard describes factors that may influence the composition of pure gases and homogeneous gas mixtures used for calibration purposes. This International Standard only applies to gases or gas mixtures that are within the “utilization period”, and it pays special attention to -storage of calibration gas cylinders; -calibration gas withdrawal from cylinders; -transfer of calibration gas from cylinders to the point of calibration. It also outlines a method of assessing the stability for a gas mixture, and takes into account the gas composition uncertainty given on the certificate and the users measurement uncertainty

Gas analysis - Handling of calibration gases and gas mixtures - Guidelines

JIS K 0115:2004 分子吸收计分析通则

この規格は，分光光度計又は光電光度計を用い，彼長範囲として200 nm付近から1 100 nm付近の，物質による光の透過，吸収又は反射を測定し，定量を行う場合の通則について規定する。ただし，原子吸光光度計，近赤外分光光度計及び赤外分光光度計を用いる方法には適用しない。

General rules for molecular absorptiometric analysis

JIS K 0147:2004 表面化学分析.词汇

この規格は，表面化学分析で用いる主な略語及び用語とその定義について規定する。なお，参考として対応英語を示すが，表記上，ISO 18115中に示されているものと語順を変えた用語がある。

Surface chemical analysis -- Vocabulary