H21 金属物理性能试验方法 标准查询与下载



共找到 546 条与 金属物理性能试验方法 相关的标准,共 37

Testing of surface quality and microtube density of silicon carbide polished wafers using confocal differential interference method

ICS
77.040
CCS
H21
发布
2023-11-27
实施
2024-06-01

Corrosion method for detecting flow pattern defects in silicon wafers

ICS
77.040
CCS
H21
发布
2023-11-27
实施
2024-06-01

High-temperature performance test method for electrochemical performance testing of lithium-ion battery cathode materials

ICS
77.160
CCS
H21
发布
2023-09-07
实施
2024-04-01

Determination of external specific surface area by powder layer permeability test under steady flow conditions of metal powder

ICS
77.160
CCS
H21
发布
2023-09-07
实施
2024-04-01

Lithium cobalt oxide electrochemical performance test first discharge specific capacity and first charge and discharge efficiency test method

ICS
77.160
CCS
H21
发布
2023-09-07
实施
2024-04-01

Lithium nickel manganese oxide electrochemical performance test first discharge specific capacity and first charge and discharge efficiency test method

ICS
77.160
CCS
H21
发布
2023-09-07
实施
2024-04-01

Method for Determination of Crystalline Orientation of Semiconductor Single Crystal

ICS
77.040
CCS
H21
发布
2023-08-06
实施
2024-03-01

Infrared reflection method for measuring the thickness of silicon carbide epitaxial layer

ICS
77.040
CCS
H21
发布
2023-08-06
实施
2024-03-01

Test method for surface gloss of silicon wafer

ICS
77.040
CCS
H21
发布
2023-08-06
实施
2024-03-01

Non-contact eddy current method for testing semiconductor wafer resistivity and semiconductor film sheet resistance

ICS
77.040
CCS
H21
发布
2023-08-06
实施
2024-03-01

X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal

ICS
77.040
CCS
H21
发布
2023-08-06
实施
2024-03-01

Laser Scattering Method for Testing Surface Defects of Silicon Carbide Epitaxial Wafers

ICS
77.040
CCS
H21
发布
2023-08-06
实施
2024-03-01

Non-contact eddy current induction method for testing non-equilibrium carrier recombination lifetime in silicon ingots, blocks and wafers

ICS
77.040
CCS
H21
发布
2023-08-06
实施
2024-03-01

Determination of Minority Carrier Lifetime in Silicon and Germanium by Photoconductivity Decay Method

ICS
77.040
CCS
H21
发布
2023-08-06
实施
2024-03-01

Corrosion evaluation chart method for aluminum and aluminum alloy anodized film and organic polymer film

ICS
25.220.20
CCS
H21
发布
2023-05-23
实施
2023-12-01

Corrosion evaluation grid method for aluminum and aluminum alloy anodized film and organic polymer film

ICS
25.220.20
CCS
H21
发布
2023-05-23
实施
2023-12-01

本文件描述了锂离子电池正极材料磷酸铁锂首次放电比容量及首次充放电效率测试方法。 本文件适用于锂离子电池正极材料磷酸铁锂首次放电比容量及首次充放电效率的测试。

Electrochemical performance test of lithium iron phosphate—Test method for the initial discharge specific capacity and the initial efficiency

ICS
77.160
CCS
H21
发布
2022-12-30
实施
2023-04-01

本文件描述了半绝缘碳化硅单晶的电阻率非接触测试方法。 本文件适用于测量电阻率范围为1×105 Ω·cm~1×1012 Ω·cm 的半绝缘碳化硅单晶片。

Test method for resistivity of semi-insulating monocrystalline silicon carbide by contactless measurement

ICS
77.040
CCS
H21
发布
2022-12-30
实施
2023-04-01

本文件描述了锂离子电池正极材料磷酸铁锂循环寿命的测试方法。 本文件适用于采用卷绕法进行锂离子电池正极材料磷酸铁锂循环寿命的测试。

Electrochemical performance test of lithium iron phosphate—Test method for cycle life

ICS
77.160
CCS
H21
发布
2022-12-30
实施
2023-04-01

本文件规定了碳化硅单晶位错密度的测试方法。 本文件适用于晶面偏离{0001}面、偏向方向0 °~8 °的碳化硅单晶位错密度的测试。

Test method for dislocation density of monocrystalline silicon carbide

ICS
77.040
CCS
H21
发布
2022-10-14
实施
2023-05-01



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