太赫兹近场显微镜 标准查询与下载
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Im Mittelpunkt der Richtlinienreihe VDI/VDE 5590 stehen systemische und anwendungstechnische Aspekte. Sie dient damit einer Verbesserung der Verst
Terahertz systems - Terms and definitions
Terahertzsysteme - Begriffe
Terahertz systems - Applications and systems
Microscopes. Designation of microscope objectives. Flatness of field/Plan
이 규격은 NSOM 적용방식의 조명방식 중 투과방식/개구방식의 NSOM 장비 및 조명집광방
Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
이 표준은 현미경 대물렌즈에서 플란(Plan) 표시의 사용에 대하여 규정하며, 평면 물체면
Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
Full Description Cross References: ISO 10934-1 All current amendments available at time of purchase are included
Microscopes. Designation of microscope objectives-Flatness of field/Plan
本标准规定了显微镜暗视场装置的基本参数、技术要求、试验方法和标志。 本标准适用于在透射光下观察的生物显微镜上使用的可拆卸之暗视场装置
Microscope - Dark field device
