扫描开尔文原子力 标准查询与下载



共找到 150 条与 扫描开尔文原子力 相关的标准,共 10

  Full Description Offers an insight into the processes of document scanning, explains the main features and benefits

Document scanning. Guide to scanning business documents

  Full Description Offers an insight into the processes of document scanning, explains the main features and benefits

Document scanning. Guide to scanning business documents

本文件规定了扫描电子显微镜原位高温力学测试装置的术语和定义、结构要求、技术要求、试验方法、检验规则、标志、包装运输和贮存、注意事项。 本文件适用于扫描电子显微镜原位高温力学测试装置的生产及检验。以下简称装置

Scanning electron microscope in-situ high temperature mechanical testing device

1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning

Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning

Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning

Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

La présente norme donne des directives pour la classification et la frappe de documents tels que procès-verbaux, circulaires, lettres. Pour les

Classification and typing of documents

State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration

BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

この規格は,走査電子顕微鏡を用いて,主として二 次電子による試料表面の微小部の形態観察と分析を行う場合の一般的事項について規定する

General rules for scanning electron microscopy

Electronic imaging - Scanning of office documents - part1:Subcontracting of scanning - Guide to detailed technical instructions for bureaux

本标准规定了扫描机用的散页和卷筒照相胶片推荐的和认可的标称尺寸、目标尺寸以及裁切公差;还规定了散页片的形状、卷筒片筒芯尺寸和卷绕要求,以及对包装标志的要求。 印刷制版用的散页片和卷筒片的尺寸在HG/T 2908中规定。使用者要注意印刷制版胶片裁切尺寸规则和扫描机胶片裁切尺寸规则是不同的

Photography.Film dimension.Film for electronic scanner use




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