X射线能谱仪(EDS) 标准查询与下载



共找到 150 条与 X射线能谱仪(EDS) 相关的标准,共 10

Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers(EDS) for use with a scanning electron microscope(SEM) or a

本标准规定了X射线光电子能谱仪的检定方法。本标准适用于使用非单色化Al或Mg X射线或单色化Al X射线,且带有溅射清洁用离子枪的X射线光电子能谱仪的检定

Verification method for X-ray photoelectron spectrometers

Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.

本标准规定了X射线荧光光谱仪的术语和定义、技术条件、检验规则、测试方法、标志、包装、贮存、运输等要求。X射线荧光光谱仪(以下简称光谱仪)。 本标准适用于包括顺序式和多通道同时式的波长色散X射线荧光光谱仪,元素分析范围从钠(Na)到铀(U),元素含量分析范围10-4%-99.99%的光谱仪

X-ray fluorescence spectrometer

本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪(EDS)特性最重要的量值。本标准仅适用于国态电离作用原理的半导体探测器EDS。本标准只规定了与电子探针(EPMA)或扫描电镜(SEM)联用的此类EDS的最低要求,至于如何实现分析则不在本标准的规定范围之内

Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪(EDS)特性最重要的性能参数。本标准仅适用于基于固态电离原理的半导体探测器能谱仪。本标准规定了与扫描电镜(SEM)或电子探针(EPMA)联用的EDS性能参数的最低要求以及核查方法。至于实际分析过程,在ISO 22309

Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis

What is this standard about? This document is designed to allow the user to assess, on a regular basis, several key parameters of an X-ray

Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English

This document is designed to allow the user to assess, on a regular basis, several key parameters of an X-ray photoelectron spectrometer

Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

本标准规定了半导体X射线探测器系统和半导体X射线能谱仪主要特性的测量方法。 本标准适用于半导体X射线探测器系统和半导体X射线能谱仪主要性能的测量

Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers

本标准规定了两种方法,用于测定 AES 和 XPS 谱仪强度标在容许线性离散限度范围内的最大计数率。它也包括校正强度非线性的方法,以便那些谱仪可使用更高的最大计数率,对于这些谱仪相关的校正公式已被证明是有效的

Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale

Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers




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