偏振仪 标准查询与下载

GB/T 31225-2014 椭圆偏振仪测量硅表面上二氧化硅薄层厚度的方法

本标准给出了使用连续变波长、变角度的光谱型椭圆偏振仪测量硅表面上二氧化硅薄层厚度的方法。本标准适用于测试硅基底上厚度均匀、各向同性、10 nm~1 000 nm厚的二氧化硅薄层厚度,其他对测试波长处不透光的基底上单层介电薄膜样品厚度测量可以参考此方法

Test method for the thickness of silicon oxide on Si substrate by ellipsometer

CIE 59-1984 偏振:定义和术语,仪器偏振(E)

Polarization: Definitions and Nomenclature, Instrument Polarization (E)

JY 141-1982 光的干涉、衍射、偏振演示仪

Light interference, diffraction, polarization demonstrator

GJB 1713-1993 纳米激光偏振干涉仪规范

Specifications for Nanolaser Polarization Interferometers

JJF 1456-2014 通信用光偏振度测试仪校准规范

本规范适用于通信用光偏振度测试仪(波长范围800 nm~1 650 nm)的校准。其他包含偏振度测试功能的仪器校准可参照本规范执行。对通信用光偏振度测试仪的光功率参数的校准可参照JJG 965《通信用光功率计》执行

Calibration Specification for Optical Degree of Polarization Meter for Telecommunications

ASTM D7298-06 用偏振滤光仪测量相对清晰度的标准试验方法

This test method assists in evaluating the effect of layout, typeface, type size, color, and background on the legibility of printed

Standard Test Method for Measurement of Comparative Legibility by Means of Polarizing Filter Instrumentation

ASTM D7298-06(2011)e1 用偏振滤光仪测量相对清晰度的标准试验方法

This test method assists in evaluating the effect of layout, typeface, type size, color, and background on the legibility of printed matter.

Standard Test Method for Measurement of Comparative Legibility by Means of Polarizing Filter Instrumentation

NAVY MIL-F-21424 A VALID NOTICE 1-1988 用于光学仪器的偏振滤光镜

MIL-F-21424A(OS) , dated 31 July 1975, has been reviewed and determined to be valid for use in acquisition

FILTERS, POLARIZING (FOR OPTICAL INSTRUMENTS)

NAVY MIL-F-21424 A-1975 用于光学仪器的偏振滤光镜

This specification covers polarizing filters for use in optical instruments

FILTERS, POLARIZING (FOR OPTICAL INSTRUMENTS)

JJF 1428-2013 光纤偏振模色散测试仪校准规范

本规范适用于光纤偏振模色散测试仪的校准

Calibration Specification of Fiber Polarization Mode Dispersion Testers

JJF 1690-2018 偏振依赖损耗测试仪校准规范

Calibration Specification for Polarization Dependent Loss Meters

ASTM D7298-06(2017 用偏振滤光器仪器测量比较易读性的标准试验方法

1.1 This test method provides an objective means to comparatively measure the ease of reading printed matter for use in package labeling. 1.2

Standard Test Method for Measurement of Comparative Legibility by Means of Polarizing Filter Instrumentation

KS B ISO 8576-2006(2021 光学和光学仪器.显微镜.偏振光显微镜的参考系统

Optics and optical instruments — Microscopes —Reference system of polarized light microscopy

KS B ISO 8576-2023 光学和光学仪器.显微镜.偏振光显微镜的参考系统

Optics and optical instruments — Microscopes — Reference system of polarized light microscopy

GSO ISO 8576:2015 光学和光学仪器 显微镜 显微偏振光参考系统

This International Standard establishes a reference system incorporating all calibrated motions of rotation and displacement on the microscope and its

Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy