扫描探针/原子力显微镜SPM/AFM 标准查询与下载



共找到 150 条与 扫描探针/原子力显微镜SPM/AFM 相关的标准,共 10

Scanning probe microscope-Method for lateral force microscope

Scanning probe microscope-Method for lateral force microscope

Scanning probe microscope-Method for lateral force microscope

本规范适用于以几何表面形貌为测量对象的扫描探针显微镜的校准。 扫描探针显微镜根据其设计原理不同,校准时需要根据实际情况选择相关的计量特性。对有特殊要求的测量任务,如对溯源要求较高的测量,不在本校准规范的适用范围

Calibration Specification for Scanning Probe Microscopes

This International Standard specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes for measuring geometric

Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems

This document specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes (SPMs) for measuring geometric

Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems

本标准规定了SPM漂移速率的术语和定义、缩略语、测量步骤、性能参数规格,及基于SPM扫描图像的漂移速率测量基波方法。 本标准适用于0.01nm/s到10nm/s的漂移速率测量。本标准中的漂移测量不适用于图像校正

Measurement methods of drift rate of scanning probe microscope

General Rules for Scanning Probe Microscopy Analytical Methods

Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

What is ISO 11952 - Scanning-probe microscopy about?   ISO 11952 is applicable for s canning-probe microscopy.   ISO

Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems

이 규격은 주사 탐침 현미경의 횡방향 수평력 현미경 기능을 이용한 미세 횡방향 수평력 측정

Scanning probe microscope-Method for lateral force microscope

State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration

Surface Chemical Analysis Scanning Probe Microscopy Determination of Geometric Quantities Using Scanning Probe Microscopy: Measurement System Calibration

1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning

Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy




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