离子溅射仪 标准查询与下载
共找到 150 条与 离子溅射仪 相关的标准，共 10 页
本标准规定了普通型式的溅射离子泵(以下简称离子泵)的型式与基本参数、要求、测量方法、检验规则、标志、包装、运输、贮存及质量保证要求。本标准适用于普通型式的溅射离子泵
Vacuum technology - Sputter ion pump
Sputtering ion pump--Testing methods
本标准规定了普通型式溅射离子泵的技术要求、检验规则、试验方法、包装、贮存等。 本标准适用于JB/T 4081所规定的二级型（L型）和三极型（3L型）的溅射离子泵
Sputtering ion pump technical conditions
本标准规定了溅射离子泵性能测试方法。
本标准适用于抽速大于10Ls(-1)的离子泵
Performance testing method of sputtering ion pump
本标准规定了普通型式的溅射离子泵的型式与基本参数。 本标准适用于二电位的二极型和三极型溅射子泵
Sputtering ion pump type and basic parameters
Ordinary two-electrode sputtering ion pump--Performance specification
Ordinary two-electrode sputtering ion pump--Parameters series
The document purpose of this Standard is to ensure that the evaluation of the features of a Ion Getter pump is to be done under uniform proceedings
Vacuum technology - Acceptance specifications for getter ion pumps
本标准规定了溅射离子泵（以下简称离子泵）性能参数的测量方法。 本标准适用于名义体积流率大于10L/s的离子泵。 本标准测量体积流率的压力范围从1.5×10－3 Pa 到 1×10－7 Pa
Vacuum technology.Sputter-ion pumps.Measurement of performance characteristics
本标准规定了负离子发射仪的术语和定义、型号、要求、试验方法、检验规则、标志、使用说明书、包装、运输、贮存。 本标准适应于净化家庭或者公共场所中污染物，增加空气中负离子的负离子发射仪
Negative ion emitter
Настоящий стандарт распространяется на геттерно-ионный насос типа ГИН-0,5-1
Type-GIN-0,5-1M getter-ion pump. Quality requirements of certified products
1.1 This practice covers the information needed to describe and report instrumentation, specimen parameters, experimental conditions, and data
Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
1.1 This practice covers the information needed to describe and report instrumentation, specimen parameters, experimental conditions, and data
Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
本标准规定了电子薄膜用高纯钛溅射靶材的要求、试验方法、检验规则和标志、包装、运输、贮存及质量证明与合同(订单)等内容。本标准适用于电子薄膜制造用的各类钛溅射靶材
High-purity sputtering titanium target used in electronic film
1.1 This guide provides the SIMS analyst with a method for determining the width of interfaces from SIMS sputtering data obtained from analyses
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
