透射电镜TEM 标准查询与下载
共找到 150 条与 透射电镜TEM 相关的标准，共 10 页
D6281-Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
1.1 This test method is a analytical procedure using transmission electron microscopy (TEM) for the determination of the concentration of asbestos
Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM) (Standard + Redline PDF Bundle)
5.1 This test method is applicable to the measurement
Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated
Measurement of Radiated Emissions From Integrated Circuits-Tem/Wideband Tem (Gtem) Cell Method; Tem Cell (150 Khz to 1 Ghz), Wideband Tem Cell (150 Khz to 8 Ghz)
本部分规定了透射电镜校准方法的术语和定义、概述、计量特性、校准条件、校准项目和校准方法、测量结果不确定度评定、校准结果表达和复校时间间隔。 本标准适用于透射电镜放大倍率、样品污染率和样品漂移率的校准
Calibration methods for transmission electron microscope
General Principles of Transmission Electron Microscopy
SAE J1752/3-2003 集成电路 TEM/宽带 TEM（GTEM）单元法的辐射发射测量； TEM 小室（150 kHz 至 1 GHz）、宽带 TEM 小室（150 kHz 至 8 GHz）
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated
Measurement of Radiated Emissions from Integrated CircuitsTEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
本标准规定了透射电子显微镜的试验方法。 本标准适用于透射电镜主机性能的试验
Test method for the transmission electron microscope
本标准规定了透射电子显微镜产品分类、技术要求、试验方法、检验规则、标志、包装、运输、贮存等。
本标准适用于加速电压200kV及其以下的电镜
Specification for transmission electron microscope
Calibration Regulations for Transmission Electron Microscopy
Calibration Regulations for Transmission Electron Microscopy
本标准规定了用透射电子显微镜对薄晶体试样微米级区域进行选区电子衍射分析的方法。本方法适用于各种金属与非金属晶体薄膜（包括粉末试样与萃取复型试样）的电子衍射分析。可分析的最小试样区直径为lμm。应用电子衍射谱可以获得试样晶体对称性、点阵常数和布拉菲格子类型等数据。利用已知晶体薄膜的电子衍射谱
Method of selected area electron diffraction for transmission electron microscopes
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2 : measurement of radiated emissions, TEM-cell and wideband TEM-cell method.
General Rules for Analysis Methods of Transmission Electron Microscopy
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