L52 红外器件 标准查询与下载

GB/T 17444-2013 红外焦平面阵列参数测试方法

本标准对红外焦平面阵列特性参数及相关量进行了定义。本标准给出了红外焦平面阵列特性参数的测试方法及测试条件。本标准适用于线列和面阵红外焦平面阵列。

Measuring methods for parameters of infrared focal plane arrays

GB/T 13584-2011 红外探测器参数测试方法

本标准规定了红外探测器(以下简称探测器)的参数测试方法及其检测设备和仪器的要求。 本标准适用于各类单元红外探测器的参数测试,也适用于多元红外探测器相应的参数测试。

Measuring methods for paramaters of infrared detectors

GB/T 18904.1-2002 半导体器件 第12-1部分;光电子器件 纤维光学系统或子系统用带/不带尾纤的光发射或红外发射二极管空白详细规范

本空白详细规范是半导体器件的一系列空白详细规范之一。

Semiconductor devices-Part 12-1: Optoelectronic devices-Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fiber optic systems or sub-systems

GB/T 17444-1998 红外焦平面阵列特性参数测试技术规范

本标准所指的焦平面，是敏感红外辐照（以下简称辐照）的光敏元阵列并带有读出电路的器件。 本标准对焦平面特性参数及相关量进行了定义。 本标准给出了焦平面主要特性参数的测试方法及测试条件。 本标准适用于线列和面阵焦平面。

The technical norms for measurement and test of characteristic parameters of infrared focal plane arrays

GB/T 15430-1995 红外探测器环境试验方法

本标准规定了红外探测器的环境试验方法。 本标准所述的试验方法为人工环境的试验方法。 本标准适用于非报警红外探测器的各类环境试验。采用本标准时有关规范要根据红外探测器可能遇到的环境条件、结构特点，从试验技术和经济等方面作出综合分析后，再规定采用哪些试验方法、严酷程度以及试验顺序等。 本标准通常是用于在条件试验期间能达到稳定温度的试验样品--即非散热样品。

Envionmental testing methods for infrared detectors

GB/T 13583-1992 红外探测器外形尺寸系列

本标准规定了红外探测器成品外形的主要尺寸及其优选系列，以及引出端的编号、识别要求。 本标准适用于室温型、杜瓦瓶制冷型、节流制冷型红外探测器，其他类型的红外探测器也可参照使用。

Outline dimension series of infrared detectors

GB/T 13584-1992 红外探测器参数测试方法

本标准规定了红外探测器（以下简称探测器）的参数测试方法及其检测设备和仪器的要求。 本标准适用于各类单元红外探测器的参数测试，也适用于多元红外探测器相应的参数测试。

Measuring methods for parameters of infrared detectors

JB/T 13579-2018 减反射膜电影放映窗口

Anti-reflective film film projection window

SJ/T 11466-2014 红外遥控接收放大器

本标准规定了环氧实体封装系列红外遥控接收放大器技术性能、试验方法、检验规则的要求。本标准适用于环氧实体封装系列红外遥控接收放大器(以下简称“产品”)。

Infrared remote control receiving amplifier

DL/T 664-2008 带电设备红外诊断应用规范

本标准给出了使用红外热像仪检测带电设备的方法、仪器要求、仪器适用范围、缺陷的判断依据及红外数据的管理规定等，使用红外测温仪（点温仪）可参照本规范执行。 本标准适用于具有电流、电压致热效应或其他致热效应的各电压等级设备，包括电机、变压器、电抗器、断路器、隔离开关、互感器、套管、电力电容器、避雷器、电力电缆、母线、导线、绝缘子、组合电器、低压电器及二次回路等。

Application rules of infrated diagnosis for live electrical equipment

KS C IEC 61920:2005 红外线应用系统

이 규격은 상호 간섭으로 발생되는 문제점들을 식별하고 분류할 목적으로 IR 장치들의 분류를

Infrared free air applications

DIN EN 61920:2004 红外传输系统.大气作用

Infrared free air applications (IEC 61920:2004); German version EN 61920:2004

BS EN 61920:2004 红外线传输系统.大气作用

This International Standard describes the classification of IR devices into groups and classes in order to identify and clarify problems caused by mutual interference. Mutual interference is caused by the increasing parallel application of different infrared (IR) systems. Due to its physical characteristics, the possibility of local limitation is a special feature of IR radiation. In this standard, the wavelength range from 700 nm to 1 600 nm is considered. All systems based on free air application which intentionally or unintentionally use IR radiation in this range, are included. Products which unintentionally emit IR radiation, such as illumination equipment are not deemed to be IR application systems. They are, however, integrated into this standard in order to enable facility planners to take into consideration and to foresee provisions against disturbance of IR application systems by such unintentionally emitted radiation. The object of this standard is to prevent or at least to minimize mutual interference and to allow the coexistence of different IR products. It is intended to identify each IR product by its characteristics, according to the classification criteria. It is not the object of this standard to describe the consequences of interference between IR systems or safety aspects of optical radiation. All applications of fibre-optic technology are excluded. In this context "free air" means freely radiated IR in indoor or outdoor applications. If the IR systems are used for information transmission, this standard is only relevant in connection with the physical layer of the open systems interconnection (OSI) reference model (ISO 7498-1). NOTE The reader should be aware that a risk of interference between different infrared systems as assessed by this standard is based on general parameters and therefore cannot take all the parameters involved into account. In many cases the practical results may differ from those expected, for example the positioning of sender and receiver and the choice of advanced coding and decoding schemes. All these factors beyond the physical layer may have an effect on the final result.

Infrared free air applications

IEC 61920:2004 红外大气作用

Describes the classification of IR devices into groups and classes in order to identify and clarify problems caused by mutual interference. Mutual interference is caused by the increasing parallel application of different infrared (IR) systems.

Infrared free air applications

SJ 20830-2002 铂硅红外焦平面探测器杜瓦组件.通用规范

General specification for PtSi infrared focal plane arrays detector-dewar assembly

SJ 20831-2002 4N红外焦平面探测器杜瓦组件参数.测试方法

Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly

SJ 20784-2000 微型杜瓦总规范

General specification for micro Dewar

DL/T 664-1999 带电设备红外诊断技术应用导则

Technical guide for infrared diagnosis of alive equipment

NF C97-036:1998 红外线传输系统.自由空气应用

Infrared transmission systems. Free air applications.

IEC 61920:1998 红外传输系统 大气作用

Infrared transmission systems - Free air applications