L56 半导体集成电路 标准查询与下载
共找到 2092 条与 半导体集成电路 相关的标准，共 140 页
Analog/Mixed-Signal Intellectual Property (IP) Core Deliverable Requirements
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-12-28
- 实施
- 2024-04-01
Analog/Mixed-Signal Intellectual Property (IP) Core Quality Assessment
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-12-28
- 实施
- 2024-04-01
3D Integrated Circuits Part 2: Calibration Requirements for Fine Pitch Stacked Chips
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-12-28
- 实施
- 2024-04-01
Guideline for analog/mix-signal intellectual property(IP) core document structure
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-12-28
- 实施
- 2024-04-01
Measurement of electromagnetic immunity of integrated circuits Part 8: Measurement of radiated immunity IC stripline method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor integrated circuit flash memory (FLASH)
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor Devices Part 16-2: Microwave Integrated Circuit Prescalers
- ICS
- 31.080.01
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2023-09-07
Semiconductor Devices Part 16-5: Microwave Integrated Circuit Oscillators
- ICS
- 31.080.01
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor integrated circuit digital-to-analog (DA) converters
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor integrated circuit driver test methods
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor integrated circuit video encoding and decoding circuit testing methods
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor Devices Part 16-10: Monolithic Microwave Integrated Circuit Technology Acceptable Procedures
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Measurements of electromagnetic immunity of integrated circuits Part 1: General conditions and definitions
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Component displacement damage test method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Integrated circuit pulse immunity measurements Part 3: Asynchronous transient injection method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-09-07
- 实施
- 2024-01-01
Semiconductor Integrated Circuit System on Chip (SoC)
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-08-06
- 实施
- 2023-12-01
Semiconductor integrated circuit analog-to-digital (AD) converter
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-08-06
- 实施
- 2023-12-01
Test method for direct digital frequency synthesizer of semiconductor integrated circuit
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-08-06
- 实施
- 2023-12-01
Test method for electronically adjustable attenuator of microwave circuit
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-08-06
- 实施
- 2024-03-01
Semiconductor Integrated Circuit Hall Circuit Test Method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2023-08-06
- 实施
- 2023-12-01
