单色器:Double out-of-plane Littrow monochromator
光栅:70 x 45 mm
UV-Vis:Ruled line diffraction grating, 1200 lines/mm blazed at 250 nm
NIR:Ruled line diffraction grating, 300 lines/mm blazed at 1192 nm
分光系统:Rotating beam splitter, which measures a sample, dark and reference signal per cycle with a speed of 30 Hz
检测器:
UV-Vis R928 PMT
NIR Cooled PbSmart PbS
分辨率 (nm)
UV-Vis<0.048 nm
NIR<0.2 nm
杂散光 (%T)
At 220 nm (10 g/L NaI ASTM method)<0.00007%
At 370 nm (50 mg/L NaNO2)<0.00007%
At 1420 nm (H2O, 1 cm pathlength)<0.0002%
At 2365 nm (CHCl3, 1 cm pathlength)<0.00045%
波长范围 (nm)(N2 purge required below 185 nm):175–3300 nm
波长准确度 (nm)
氘灯lines
UV-Vis: 190–900 nm ± 0.08 nm
NIR: 760–3000 nm ± 0.4 nm
波长重复性 (nm)
Peak separation of repetitive scanning of a UV-Vis line source<0.025 nm
Peak separation of repetitive scanning of a IR line source<0.1 nm
Standard deviation of 10 measurements, UV-Vis<0.005 nm
Standard deviation of 10 measurements, NIR<0.02 nm
光谱准确度(Abs)
Using double aperture method at 0.3 Abs UV-Vis<0.00025 Abs
光谱线性 (Abs)
All tests performed by addition of fi lters technique UV-Vis (465 nm, 10 s SAT, 2 nm SBW), NIR (1200 nm, 10 s SAT, energy 3)
UV-Vis, at 1 Abs<0.0007 Abs
UV-Vis, at 2 Abs<0.0014 Abs
UV-Vis, at 3 Abs<0.005 Abs
NIR, at 1 Abs<0.0015 Abs
NIR, at 2 Abs<0.007 Abs
光谱范围 (Abs): 10 Abs
光谱重现性 (Abs):
Using NIST 930D fi lters, at 546.1 nm, 2 s SAT, 2 nm SBW
0.5 Abs, Standard deviation for 10 measurements<0.00008
1.0 Abs, Standard deviation for 10 measurements<0.00014
光谱稳定性 (Abs/hour)2小时预热后, 500 nm, 1 s SAT, 2 nm SBW:<0.00018
光谱噪音 (Abs/RMS)
UV-Vis (190 nm, 1 s SAT, 2 nm SBW)
At 0 Abs<0.00009
At 1 Abs<0.0002
UV-Vis (500 nm, 1 s SAT, 2 nm SBW)
At 0 Abs<0.00003
At 1 Abs<0.00005
At 2 Abs<0.0001
At 3 Abs with 1.5 Abs RBA<0.0003
At 4 Abs with 1.5 Abs RBA<0.0008
At 5 Abs with 1.5 Abs RBA<0.002
At 6 Abs with 3.0 Abs RBA<0.0045
NIR: Fixed SBW
(1500 nm, 1 s SAT, 2 nm SBW
At 0 Abs<0.00003
At 1 Abs<0.0001
At 2 Abs<0.0005
At 3 Abs<0.007
NIR: Variable SBW
(1500 nm, 1 s SAT, Energy 1)
At 0 Abs<0.00004
At 2 Abs<0.0005
At 3 Abs with 1.5 Abs RBA<0.0003
Baseline flatness 基线平直度 (Abs)
UV-Vis (0.1 s SAT, 4 nm SBW),NIR (0.2 s SAT, Energy 1), baseline corrected:± 0.0012 (200 to 3000 nm)
UV-Vis (0.2 s SAT, 2 nm SBW), NIR (0.24 s SAT, Energy 1), no smoothing applied:± 0.0007 (200 to 3000 nm)
样品室光束分离Sample compartment beam separation (mm) 190.5 mm
样品室尺寸 (width x depth x height)
Extended sample compartment fi tted:160 x 433 x 221 mm
Access接触:Top, front and base
仪器尺寸 (width x depth x height) 1020 x 710 x 378 mm
Purging吹扫
Sample compartment Yes
Optics Yes
仪器重量:91 kg
选项:
光谱带宽 (nm)*
UV-Vis 0.01–5.00 nm, 0.01 nm steps
NIR 0.04–20 nm
* At optimum environmental conditions. See page 5 for details.
信号平均(秒):0.033–999 s
zei高扫描速度 (nm/min)
UV-Vis 2000 nm/min
NIR 8000 nm/min
Slew rate(changing between wavelengths, nm/min)
UV-Vis 16000 nm/min
NIR 64000 nm/min
数据间隔 (UV-Vis)
(nm): 0.005–1.111 nm
cm-1* :1.627–17.335 cm-1*
Å:0.05–11.1 Å
数据间隔 (NIR)
(nm): 0.02–4.444 nm
cm-1* :0.3145–4.0753 cm-1*
Å :0.2–44.44 Å
* Interval range is dependent upon scan range
Repetitive scanning重复扫描
Maximum number of cycles 999
Maximum cycle time (min) 9999
Cary UMA Specifications
测量方法:
• Absolute specular refl ection at variable angle from 5 to 85 degrees in 0.02 degree intervals
• Direct transmission and variable angle transmission from 0 to 180 degrees in 0.02 degree intervals
• Diffuse scattering, refl ection or transmission through independent sample rotation (360 degrees) and detector positioning (10 – 350 degrees) at 0.02 degree intervals
• Absorptance, A where A= 1 – R – T at variable angle without moving the sample or beam onto the sample for improved productivity and greater accuracy
• Reflection/Transmission at single wavelength (read) or wavelength range (scan)
波长范围:190 – 2800 nm
Auto Polarizer Wavelength Range:250 – 2500 nm
检测器:Two-colored Si/InGaAs
Aperture Masks:
Incident beam: 1, 2 and 3 degrees
Detector: 1, 1.8, 2, 3, 4, 4.4, 5 and 6 degrees
附件:
Cary 7000 UMS Accessories
• Diffuse Reflectance Accessory (DRA ) – Internal (110mm sphere) and External (150mm sphere)
• Fixed angle Specular Refl ectance Accessories (SRA)
• Variable Angle Specular Refl ectance Accessory (VASRA)
• Polarizers – Glan Taylor, Glan Thompson and Wire Grid
• Variable angle transmission holder
• Automated thin fi lm holder
• Peltier temperature software controlled single and multi-cell cuvette holders
支持政策Support policies
Type Policy
Warranty 12 months, though this may vary according to location
Hardware support period Seven (7) years from date of last unit manufacture. After this time, parts and supplies will be provided
if available
Software support Telediagnostic capability is available for some instrument models. Availability of Telediagnostic
support may vary according to location. Software upgrades to add additional functionality will attract
a fee
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