VDI/VDE 2634 Blatt 2-2000
Optical 3D measuring systems - Systems based on area scanning

Optische 3D-Messsysteme - Systeme mit flaechenhafter Antastung


哪些标准引用了VDI/VDE 2634 Blatt 2-2000

 

找不到引用VDI/VDE 2634 Blatt 2-2000 的标准

标准号
VDI/VDE 2634 Blatt 2-2000
发布
2000年
发布单位
VDI - Verein Deutscher Ingenieure
替代标准
VDI/VDE 2634 Blatt 2-2002
当前最新
VDI/VDE 2634 Blatt 2-2012
 
 

VDI/VDE 2634 Blatt 2-2000相似标准

VDI/VDE 2634 Blatt 1-2000 Optical 3D measuring systems - Imaging systems with point-by-point sensing ITU-T G.958 SPANISH-1990 Digital line systems based on the synchronous digital hierarchy for use on optical fibre cables VDI/VDE 2623-1976 Measuring systems for length control on machine tools VDI 3950 BLATT 2-2019 Stationary source emissions - Quality assurance of automated measuring systems and data evaluation systems - Requirements on the documentation VDI 4202 Blatt 2-2003 Minimum requirements for suitability tests of ambient air measuring systems - Optical remote sensing

推荐

网路讲座直播：用于检测样品各种属性的AFM多样化扫描模式 (with live demo)

AFM shows high utilization in the research field due to complementary relationships with optical microscopy, electron microscopy and other measuring equipment....

2023年美国光学学会新增会士名单公布!

imaging and spectroscopy for cancer detectionChangyuan YuThe Hong Kong Polytechnic Univ, Hong KongFor significant contributions to signal processing in optical fiber communication and sensing systems,...

用横向力显微镜进行材料成分鉴定

fromPark Systems....

采用Park AFM的精确纳米力学模式进行牙齿美白研究

Overall, PinPoint™ Nanomechanical Modeintroduced by Park Systems is an ideal approach to characterize and quantify mechanical properties at nanoscale, with faster scanning speed and maximizedtip life due...


Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证：京ICP证110310号