TM-650 2.1.1.2A-2004

Microsectioning-Semi or Automatic Technique Microsection Equipment (Alternate)


 

 

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标准号
TM-650 2.1.1.2A-2004
发布日期
2004年05月01日
实施日期
2015年06月20日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
IPC - Association Connecting Electronics Industries
引用标准
5
适用范围
This procedure is an alternate method for preparing multiple metallographic specimen(s) using microsection equipment. The specimen(s) is(are) for evaluation for quality of the laminate system@ plated-through holes (PTHs)@ the copper foils@ platings@ and/or coatings. The same basic procedure may be used for examination of other areas on the product. Note: This microsection technique is a process and not a test method. Note: SAFETY The use of the materials listed in Section 4 may be limited or forbidden in some environments. Please review the Material Safety Data Sheet (MSDS) for the materials being used.




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