IEC 60444-9:2007
石英晶体元件参数测量.第9节:压电晶体元件寄生振荡测量

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

标准号

IEC 60444-9:2007

发布

2007年

发布单位

国际电工委员会

当前最新

IEC 60444-9:2007

 

 

被代替标准

IEC 49/764/FDIS:2006 IEC/TR 60283:1968

适用范围

This part of IEC 60444 describes two methods for determining the spurious (unwanted) modes of piezoelectric crystal resonators. It extends the capabilities and improves the reproducibility and accuracy compared to previous methods. The previous methods described in IEC 60283 (1968) were based on the use of a measuring bridge, which applies to non-traceable components such as variable resistors and a hybrid transformer, which are no longer commercially available. Method A (Full parameter determination) Full parameter determination allows the determination of the equivalent parameters of the spurious resonances and is based on the methods described in IEC 60444-5 using the same measurement equipment. It is the preferred method, which can be applied to the measurement of low and medium impedance spurious resonances up to several kQ. Method B (Resistance determination) Resistance determination should be used for the determination of high impedance spurious resonances as specified, for example for certain filter crystals. It uses the same test equipment as method A in conjunction with a test fixture, which consists of commercially available microwave components such as a 180° hybrid coupler and a 10 dB attenuator, which are well-defined in a 50 Q environment. This method is an improvement to the "reference method" of the obsolete IEC 60283.

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