IEC/PAS 60679-6-2008
经质量评估的石英晶体受控振荡器.第6部分:石英晶体振荡器和SAW振荡器用相位抖动测量法.应用指南

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide


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标准号
IEC/PAS 60679-6-2008
发布日期
2008年02月
实施日期
废止日期
中国标准分类号
L21
国际标准分类号
31.140
发布单位
IX-IEC
代替标准
IEC 60679-6-2011
适用范围
This PAS applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to 700 MHz. This PAS applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these oscillators and modules will be referred to as “oscillator(s)” for simplicity.




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