DLA SMD-5962-95813 REV E-2007
反射变硬互补金属氧化物半导体双重单刀双掷开关硅单片电路线型微电路

MICROCIRCUIT, LINEAR RADIATION HARDENED CMOS, DUAL SPDT ANALOG SWITCHES, MONOLITHIC SILICON


 

 

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标准号
DLA SMD-5962-95813 REV E-2007
发布日期
2007年02月27日
实施日期
废止日期
中国标准分类号
J16
国际标准分类号
23.060
发布单位
US-DLA
适用范围
This drawing documents three product assurance class levels consisting of high reliability (device classes Q andM), space application (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class T, the user is encouraged to review the manufacturer’s Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application.




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