IEC/PAS 61338-1-5-2010
波导型电介质谐振器.第1-5部分:基本资料和试验条件.微波频率下导体层和电介质基片间接口传导性测量方法
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
IEC/PAS 61338-1-5-2010 中，可能用到以下仪器设备
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- 标准号
- IEC/PAS 61338-1-5-2010
- 发布日期
- 2010年05月
- 实施日期
- 废止日期
- 无
- 中国标准分类号
- L26
- 国际标准分类号
- 31.140;33.120.10
- 发布单位
- IX-IEC
- 适用范围
- Microwave circuits are popularly formed on multi-layered organic or non-organic substrates. In the microwave circuits, the attenuation of planar transmission lines such as striplines, microstrip lines, and coplanar lines are determined by their conductor loss, dielectric loss and radiation loss. Among them, the conductor loss is a major factor in the attenuation of the planar transmission lines. A new measurement method is needed to evaluate the conductivity of transmission line on or in the substrates such as the organic, ceramic and LTCC (low temperature co-fired ceramics) substrates.