This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal
oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter
that allows the accurate measurement of r.m.s. jitter.
In the measurement method, phase noise measurement equipment or a phase noise
measurement system is used.
The measuring frequency range is from 10 MHz to1 000 MHz.
This standard applies to quartz crystal oscillators and SAW oscillators used in electronic
devices and modules that have the multiplication or division functions based on these
oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the
following text, these oscillators and modules will be referred to as “oscillator(s)” for simplicity.