ANSI/ESD SP5.2.1-2012
机器型号（MM）替代测试方法：供应引脚组合 组件级
Machine Model (MM) Alternative Test Method: Supply Pin Ganging - Component Level
- 标准号
- ANSI/ESD SP5.2.1-2012
- 发布
- 2013年
- 发布单位
- 美国静电协会
- 适用范围
- For those high pin count components (e.g., ball grid array) that interconnect different power leads through common, low-resistance power and ground planes in the package, the number of power and ground leads can be reduced by ganging or grouping supply pins together on a custom test fixture board. A minimum number of power supply pins (i.e., power or ground) should be ganged to bring the total number of tester channels used equal to the number of tester channels available on the tester. NOTE: ANSI/ESD SP5.2.1 does not cover the testing of the signal pins of high pin count devices. It is recommended to use ANSI/ESD SP5.2.2.