SAE J1879-2014
机车用半导体器件耐用性认证手册
Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications
SAE J1879-2014 发布历史
This document will primarily address intrinsic reliability of electronic components for use in automotive electronics. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. The current handbook primarily focuses on integrated circuit subjects, but can easily be adapted for use in discrete or passive device qualification with the generation of a list of failure mechanisms relevant to those components. Semiconductor device qualification is the main scope of the current handbook. Other procedures addressing extrinsic defects are particularly mentioned in the monitoring chapter. Striving for the target of Zero Defect
SAE J1879-2014由美国机动车工程师协会 US-SAE 发布于 2014-02-21，并于 2014-02-25 实施。
SAE J1879-2014 在中国标准分类中归属于: L40 半导体分立器件综合,S41 电力机车，在国际标准分类中归属于: 43.040.10 电气和电子设备。
SAE J1879-2014的历代版本如下：
- 1988年10月01日 SAE J1879-1988 汽车用集成电路的通用合格条件和产品验收准则
- 2007年10月01日 SAE J1879-2007 机车用半导体器件耐用性认证手册
- 2014年02月21日 SAE J1879-2014 机车用半导体器件耐用性认证手册
- 标准号
- SAE J1879-2014
- 发布日期
- 2014年02月21日
- 实施日期
- 2014年02月25日
- 废止日期
- 无
- 中国标准分类号
- L40;S41
- 国际标准分类号
- 43.040.10
- 发布单位
- 美国机动车工程师协会
- 被代替标准
- SAE J 1879-2007
- 适用范围
- This document will primarily address intrinsic reliability of electronic components for use in automotive electronics. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. The current handbook primarily focuses on integrated circuit subjects, but can easily be adapted for use in discrete or passive device qualification with the generation of a list of failure mechanisms relevant to those components. Semiconductor device qualification is the main scope of the current handbook. Other procedures addressing extrinsic defects are particularly mentioned in the monitoring chapter. Striving for the target of Zero Defect