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neutron beam
neutron beam, Total:18 items.
In the international standard classification, neutron beam involves: Non-destructive testing, Semiconductor devices, Sterilization and disinfection, Welding, brazing and soldering.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, neutron beam
- GB/T 31362-2015 Non-destructive testing.Thermal neutron radiographic testing.Determination of beam L/D ratio
International Organization for Standardization (ISO), neutron beam
- ISO 12721:2000 Non-destructive testing - Thermal neutron radiographic testing - Determination of beam L/D ratio
Korean Agency for Technology and Standards (KATS), neutron beam
- KS B ISO 12721:2008 Non-destructive testing－Thermal neutron radiographic testing－Determination of beam L/D ratio
British Standards Institution (BSI), neutron beam
- BS EN 60749-44:2016 Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Association Francaise de Normalisation, neutron beam
- NF EN 60749-44:2016 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 44 : méthode d'essai des effets d'un événement isolé (SEE) irradié par un faisceau de neutrons pour des dispositifs à semiconducteurs
- NF C96-022-44*NF EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44 : neutron beam irradiated single event effect (SEE) test method for semiconductor devices
ES-UNE, neutron beam
- UNE-EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
- UNE-EN 300386 V1.5.1:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
German Institute for Standardization, neutron beam
- DIN EN 60749-44:2017-04 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
- DIN EN 60749-44:2017 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
PH-BPS, neutron beam
- PNS IEC 60749-44:2021 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Sichuan Provincial Standard of the People's Republic of China, neutron beam
- DB51/T 2959-2022 General Technical Specifications for Electron Beam Irradiation of Traditional Chinese Medicine
International Electrotechnical Commission (IEC), neutron beam
- IEC 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
European Committee for Electrotechnical Standardization（CENELEC）, neutron beam
- EN 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
RO-ASRO, neutron beam
American Society for Testing and Materials (ASTM), neutron beam
- ASTM E2861-16 Standard Test Method for Measurement of Beam Divergence and Alignment in Neutron Radiologic Beams
- ASTM E2861-16(2020) Standard Test Method for Measurement of Beam Divergence and Alignment in Neutron Radiologic Beams
Association of German Mechanical Engineers, neutron beam
- DVS 2703-1975 Electron-beam welding in aeronautics and space navigation; survey of methods and machinery