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Precious metal paste

Precious metal paste, Total:18 items.

In the international standard classification, Precious metal paste involves: Non-ferrous metals, Products of non-ferrous metals, Testing of metals.


General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Precious metal paste

  • GB/T 17472-1998 Specification for pastes of precious metals
  • GB/T 17472-2008 Specification for pastes of precious metal used for microelectronics
  • GB/T 17472-2022 Specification for pastes of precious metal used for microelectronics
  • GB/T 17473.2-2008 Test method of precious metals pastes used for microelectronics.Determination of fineness
  • GB/T 17473.3-2008 Test method of precious metals pastes used for microelectronics.Determination of sheet resistance
  • GB/T 17473.5-2008 Test method of precious metals pastes used for microelectronics.Determination of viscosity
  • GB/T 17473.4-2008 Test methods of precious metals pastes used for microelectronics.Determination of adhesion
  • GB/T 17473.6-2008 Test method of precious metals pastes used for microelectronics.Determination of resolution
  • GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness
  • GB/T 17473.3-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of sheet resistance
  • GB/T 17473.1-2008 Test method of precious metals pastes used for microelectronics.Determination of solids content
  • GB/T 17473.5-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of viscosity
  • GB/T 17473.6-1998 Test methods of precious metal pastes used for thick-film microelectronics--Determination of resolution
  • GB/T 17473.4-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of adhesion
  • GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of solids content
  • GB/T 17473.7-2008 Test method of precious metals pastes used for microelectronics.Determination of solderability and solderelaching resistance
  • GB/T 17473.7-1998 Test methods of precious metal pastes used for thick-film microelectronics--Test of solderability and solderleaching resistance

国家市场监督管理总局、中国国家标准化管理委员会, Precious metal paste

  • GB/T 17473.7-2022 Test methods of precious metals pastes used for microelectronics—Part 7: Determination of solderability and solder leaching resistance




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