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Dielectric property measurement

Dielectric property measurement, Total:5 items.

In the international standard classification, Dielectric property measurement involves: Semiconductor devices, Ceramics, Radiocommunications.

Japanese Industrial Standards Committee (JISC), Dielectric property measurement

• JIS R 1660-1:2004 Measurement method for dielectric properties of fine ceramics in millimeter wave frequency range -- Part 1: Cutoff waveguide method
• JIS R 1660-2:2004 Measurement method for dielectric properties of fine ceramics in millimeter wave frequency range -- Part 2: Open resonator method
• JIS R 1660-3:2004 Measurement method for dielectric properties of fine ceramics in millimeter wave frequency range -- Part 3: Dielectric resonator method excited by NRD-guide

American National Standards Institute （ANSI), Dielectric property measurement

• ANSI/IEEE 356:2010 Guide for Measurements of Electromagnetic Propoerties of Earth Media

Consumer Electronics Association （U.S.), Dielectric property measurement

• CEA-774-B-2009 TV Receiving Antenna Performance Presentation and Measurement

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