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Platinum electrode
Platinum electrode, Total:78 items.
In the international standard classification, Platinum electrode involves: Non-ferrous metals, Products of non-ferrous metals, Machine tools, Equipment for the metallurgical industry, Nuclear energy engineering, Electrical engineering in general, Chipless working equipment, Insulating materials, Semiconductor devices, Iron and steel products, Integrated circuits. Microelectronics, Resistors, Capacitors, Welding, brazing and soldering.
Professional Standard - Non-ferrous Metal, Platinum electrode
IN-BIS, Platinum electrode
(U.S.) Ford Automotive Standards, Platinum electrode
Military Standard of the People's Republic of China-General Armament Department, Platinum electrode
- GJB 956A-2003 Specification for resistance strain platinum-tungsten alloy sheets, strips, foils and wires
Hebei Provincial Standard of the People's Republic of China, Platinum electrode
Group Standards of the People's Republic of China, Platinum electrode
American Society for Testing and Materials (ASTM), Platinum electrode
- ASTM C1165-22 Standard Test Method for Determining Plutonium by Controlled-Potential Coulometry in H2SO4 at a Platinum Working Electrode
- ASTM D5288-97 Standard Test Method for Determining the Tracking Index of Electrical Insulating Materials Using Various Electrode Materials (Excluding Platinum)
- ASTM C1165-90(2005) Standard Test Method for Determining Plutonium by Controlled-Potential Coulometry in H2SO4 at a Platinum Working Electrode
- ASTM C1165-90(2000)e1 Standard Test Method for Determining Plutonium by Controlled-Potential Coulometry in H2SO4 at a Platinum Working Electrode
- ASTM C1165-12 Standard Test Method for Determining Plutonium by Controlled-Potential Coulometry in H2SO4 at a Platinum Working Electrode
- ASTM C1165-17 Standard Test Method for Determining Plutonium by Controlled-Potential Coulometry in H2SO4 at a Platinum Working Electrode
- ASTM D5288-14 Standard Test Method for Determining Tracking Index of Electrical Insulating Materials Using Various Electrode Materials (Excluding Platinum)
- ASTM D5288-21 Standard Test Method for Determining Tracking Index of Electrical Insulating Materials Using Various Electrode Materials (Excluding Platinum)
- ASTM D5288-10 Standard Test Method for Determining the Tracking Index of Electrical Insulating Materials Using Various Electrode Materials (Excluding Platinum)
- ASTM C1165-23 Standard Test Method for Determining Plutonium by Controlled-Potential Coulometry in H2SO4 at a Platinum Working Electrode
工业和信息化部, Platinum electrode
Electronic Components, Assemblies and Materials Association, Platinum electrode
American National Standards Institute (ANSI), Platinum electrode
- ANSI/ASTM D5288:2010 Test Method for Determining the Tracking Index of Electrical Insulating Materials Using Various Electrode Materials (Excluding Platinum)
Defense Logistics Agency, Platinum electrode
- DLA SMD-5962-88677 REV C-2009 MICROCIRCUIT, DIGITAL, 4-BIT BIPOLAR MICROPROCESSOR SLICE, MONOLITHIC SILICON
- DLA SMD-5962-88605 REV B-2001 MICROCIRCUIT, DIGITAL, BIPOLAR HIGH PERFORMANCE 10-BIT BUFFER, MONOLITHIC SILICON
- DLA DSCC-DWG-04052-2006 CAPACITOR, FIXED, MULTIPLE ANODE POLYMER TANTALUM CHIP
- DLA MIL-M-38510/10 D VALID NOTICE 1-2009 Microcircuits, Digital, Bipolar, TTL, Decoders Monolithic Silicon
- DLA MIL-M-38510/13 G VALID NOTICE 1-2010 Microcircuits, Digital, Bipolar, TTL, Counters Monolithic Silicon
- DLA SMD-5962-86727 REV B-2011 MICROCIRCUIT, DIGITAL, BIPOLAR, BCD COUNTER MONOLITHIC SILICON
- DLA SMD-5962-95567 REV A-2002 MICROCIRCUIT, LINEAR, CLOSED LOOP HIGH SPEED BUFFER, MONOLITHIC SILICON
- DLA SMD-5962-96843 REV D-2008 MICROCIRCUIT, LINEAR, VOLTAGE REFERENCE DIODE, 1.2 VOLTS, MONOLITHIC SILICON
- DLA MIL-M-38510/161 A-2005 MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, COMMON OR GATES, MONOLITHIC SILICON
- DLA SMD-5962-87791 REV B-1989 MICROCIRCUITS, DIGITAL, BIPOLAR, FIRST-IN FIRST-OUT (FIFO), MONOLITHIC SILICON
- DLA MIL-M-38510/3 G VALID NOTICE 1-2009 Microcircuits, Digital, Bipolar, TTL, Nand Buffers Monolithic Silicon
- DLA MIL-M-38510/503 B VALID NOTICE 4-2010 Microcircuits, Digital, Bipolar, Programmable Logic, Monolithic Silicon
- DLA MIL-M-38510/505 C VALID NOTICE 1-2010 Microcircuits, Digital, Bipolar Programmable Logic, Monolithic Silicon
- DLA SMD-5962-86715 REV C-2011 MICROCIRCUITS, DIGITAL, BIPOLAR, D-TYPE REGISTER, MONOLITHIC SILICON
- DLA SMD-5962-86728 REV B-2011 MICROCIRCUIT, DIGITAL, BIPOLAR, HIGH SPEED REGISTER, MONOLITHIC SILICON
- DLA SMD-5962-87755 REV C-2011 MICROCIRCUIT, DIGITAL, BIPOLAR, BUFFERED REGISTERS, MONOLITHIC SILICON
- DLA MIL-M-38510/3 G (1)-2012 MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, NAND BUFFERS MONOLITHIC SILICON
- DLA SMD-5962-87683 REV D-2013 MICROCIRCUIT, DIGITAL, BIPOLAR ALS TTL, DECODER, MONOLITHIC SILICON
- DLA SMD-5962-78019 REV E-2006 MICROCIRCUIT, LINEAR, DUAL, HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON
- DLA SMD-5962-85065 REV A-1988 MICROCIRCUITS, DIGITAL, BIPOLAR, PROGRAMMABLE, LOGIC, MONOLITHIC SILICON
- DLA SMD-5962-87755 REV B-2005 MICROCIRCUIT, DIGITAL, BIPOLAR, BUFFERED REGISTERS, MONOLITHIC SILICON
- DLA SMD-5962-88515-1988 MICROCIRCUITS, DIGITAL, BIPOLAR, PROGRAMMABLE LOGIC, MONOLITHIC SILICON
- DLA SMD-5962-89930 REV C-2003 MICROCIRCUIT, LINEAR, DUAL POLARITY TRACKING VOLTAGE REGULATOR, MONOLITHIC SILICON
- DLA SMD-5962-88604 REV B-2007 MICROCIRCUIT, DIGITAL, BIPOLAR, BIDIRECTIONAL TRANSCEIVERS, MONOLITHIC SILICON
- DLA SMD-5962-88666-1988 MICROCIRCUITS, DIGITAL, BIPOLAR, INTERRUPT HANDLER, MONOLITHIC SILICON
- DLA SMD-5962-88763-1990 MICROCIRCUIT, LINEAR, DUAL-POLARITY TRACKING VOLTAGE REGULATOR, MONOLITHIC SILICON
- DLA SMD-5962-89549-1989 MICROCIRCUITS, DIGITAL, BIPOLAR, PIPELINE REGISTER WITH SHADOW REGISTER, MONOLITHIC SILICON
- DLA SMD-5962-86023 REV D-2011 MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR 256-BIT RAM, MONOLITHIC SILICON
- DLA SMD-5962-86051 REV D-2011 MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR 64-BIT RAM, MONOLITHIC SILICON
- DLA MIL-M-38510/9 E VALID NOTICE 1-2009 Microcircuits, Digital, Bipolar TTL, Shift Registers, Monolithic Silicon
- DLA MIL-M-38510/150 D VALID NOTICE 1-2009 Microcircuits, Digital, Bipolar, TTL, Magnitude Comparators, Monolithic Silicon
- DLA SMD-5962-86725 REV B-2009 MICROCIRCUIT, DIGITAL, BIPOLAR, OCTAL BUFFER, MONOLITHIC SILICON
- DLA MIL-M-38510/22 D VALID NOTICE 1-2010 Microcircuits, Digital, Bipolar, High-Speed TTL, Flip-Flops, Monolithic Silicon
- DLA MIL-M-38510/80 F VALID NOTICE 1-2010 Microcircuits, Digital, Bipolar, Schottky TTL, and Gates, Monolithic Silicon
- DLA SMD-5962-78015 REV J-2010 MICROCIRCUIT, DIGITAL, BIPOLAR, MEMORY, 64-BIT RAM, MONOLITHIC SILICON
- DLA SMD-5962-88763 REV A-2010 MICROCIRCUIT, LINEAR, DUAL POLARITY TRACKING VOLTAGE REGULATOR, MONOLITHIC SILICON
- DLA SMD-5962-89930 REV D-2011 MICROCIRCUIT, LINEAR, DUAL POLARITY TRACKING VOLTAGE REGULATOR, MONOLITHIC SILICON
- DLA SMD-5962-89930 REV E-2013 MICROCIRCUIT, LINEAR, DUAL POLARITY TRACKING VOLTAGE REGULATOR, MONOLITHIC SILICON
- DLA DSCC-DWG-89085 REV C-2006 CAPACITORS, FIXED, ELECTROLYTIC POLARIZED, ALUMINUM OXIDE, SNAP MOUNT, LOW PROFILE
- DLA SMD-5962-97548 REV A-2006 MICROCIRCUIT, DIGITAL, BIPOLAR, SYNCHRONOUS 4-BIT COUNTER, MONOLITHIC SILICON
- DLA SMD-5962-94676 REV F-2005 MICROCIRCUIT, LINEAR, CURRENT FEEDBACK AMPLIFIER, ULTRA HIGH SPEED, MONOLITHIC SILICON
- DLA SMD-5962-96756 REV B-2007 MICROCIRCUIT, LINEAR, RADIATION HARDENED, ULTRA HIGH SPEED, CURRENT FEEDBACK AMPLIFIER WITH OFFSET ADJUST, MONOLITHIC SILICON
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Platinum electrode
- GB/T 33970-2017 Al2O3 dispersion strengthened copper sheet for resistance welding electrode
Guizhou Provincial Standard of the People's Republic of China, Platinum electrode
- DB52/T 928-2014 CA45S Type Bottom Electrode Chip Type Solid Electrolyte Tantalum Fixed Capacitor
Association Francaise de Normalisation, Platinum electrode
- NF A81-304:1994 Covered electrodes for manual metal arc welding. Deposition of a weld metal pad for chemical analysis.