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Atomic Force and Scanning Tunneling

Atomic Force and Scanning Tunneling, Total:5 items.

In the international standard classification, Atomic Force and Scanning Tunneling involves: Linear and angular measurements.

American Society for Testing and Materials (ASTM), Atomic Force and Scanning Tunneling

• ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

RU-GOST R, Atomic Force and Scanning Tunneling

• GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

German Institute for Standardization, Atomic Force and Scanning Tunneling

• DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

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