ZH
RU
ES
subtrahend
subtrahend, Total:22 items.
In the international standard classification, subtrahend involves: Non-destructive testing, Electrical wires and cables, Education, Pipeline components and pipelines, Wind turbine systems and other alternative sources of energy, Products of the chemical industry, Products of the textile industry.
US-AAMI, subtrahend
Japanese Industrial Standards Committee (JISC), subtrahend
- JIS Z 2354:2012 Method for measurement of ultrasonic attenuation coefficient of solids
German Institute for Standardization, subtrahend
- DIN VDE 0472-507:1983 Testing of cables, wires and flexible cords; reduction factor [VDE Specification]
- DIN 57789-100:1984 Classrooms and laboratories fitments equipment and furniture safety specification for powered constructional units [VDE Specification]
- DIN 57472-507:1983 Testing of cables, wires and flexible cords; reduction factor [VDE Specification]
- DIN 2616-1:1991 Steel butt-welding pipe fittings; eccentric reducers with reduced pressure factor
ESDU - Engineering Sciences Data Unit, subtrahend
- TM 183-2017 Technical Memorandum Compendium of Vibration Damping Data for Aerospace Structures
BELST, subtrahend
- STB 1775-2010 Energy conservation. Classification of parameter. General
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, subtrahend
- GB/T 5441.7-1985 Test methods for communication cable--Attenuation coefficient test--Open and short circuit method
- GB/T 14802-1993 Textiles. Determination of smoke density. Light extinction method
ANS - American Nuclear Society, subtrahend
- 6.4.3 ERRATUM-1991 Gamma-Ray Attenuation Coefficients and Buildup Factors for Engineering Materials
- 6.4.3-1991 Gamma-Ray Attenuation Coefficients and Buildup Factors for Engineering Materials
Defense Logistics Agency, subtrahend
- DLA SMD-5962-96608 REV D-2010 MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, PRESETTABLE UP/DOWN COUNTER, MONOLITHIC SILICON
- DLA DSCC-VID-V62/04702 REV A-2011 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-STAGE SYNCHRONOUS DOWN COUNTER, MONOLITHIC SILICON
- DLA SMD-5962-95621 REV D-2010 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, PRESETTABLE UP/DOWN COUNTER, MONOLITHIC SILICON
- DLA SMD-5962-87544 REV D-2013 MICROCIRCUIT, DIGITAL, BIPOLAR SYNCHRONOUS FOUR-BIT BINARY UP-DOWN COUNTER, MONOLITHIC SILICON
- DLA SMD-5962-87724 REV C-2008 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 4-BIT SYNCHRONOUS BINARY UP/DOWN COUNTER, MONOLITHIC SILICON
Korean Agency for Technology and Standards (KATS), subtrahend
- KS B 0532-1995 Method for measurement of ultrasonic attenuation coefficient of solid by pulse echo technique
- KS B 0532-2005(2010) Method for measurement of ultrasonic attenuationcoefficient of solid by pulse echo technique
国家能源局, subtrahend
- NB/T 10992-2022 Method for determining the reduction coefficient for wind turbine power generation evaluation
Taiwan Provincial Standard of the People's Republic of China, subtrahend
- CNS 5850-1980 Reduction of Permissible Strees as a Function of Time and Temperature for Polypropylene Pipes
PL-PKN, subtrahend