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X-ray stress analysis and X-ray diffraction analysis
X-ray stress analysis and X-ray diffraction analysis, Total:355 items.
In the international standard classification, X-ray stress analysis and X-ray diffraction analysis involves: Analytical chemistry, Non-ferrous metals, Refractories, Power stations in general, Radiation protection, Non-destructive testing, Products of the chemical industry, Occupational safety. Industrial hygiene, Testing of metals, Inorganic chemicals, Construction materials, Particle size analysis. Sieving, Vocabularies, Ferrous metals, Optics and optical measurements, Air quality, Radiation measurements, Nuclear energy engineering, Non-metalliferous minerals, Metalliferous minerals, Iron and steel products, Electronic tubes, Semiconducting materials, Paint ingredients, Education, Ferroalloys, Products of non-ferrous metals, Medical equipment, Laboratory medicine, Optical equipment, Medical sciences and health care facilities in general, Petroleum products in general, Coals, Photography, Water quality, Protection against fire.
PT-IPQ, X-ray stress analysis and X-ray diffraction analysis
Korean Agency for Technology and Standards (KATS), X-ray stress analysis and X-ray diffraction analysis
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
- KS M 0017-2010 General rules for X-ray fluorescence spectrometric analysis
- KS L 5222-2009 Chemical analysis method of cement by x-ray fluorescence
- KS D 1898-1993 Method for fluorescent X-ray analysis of copper alloys
- KS D 1654-1993 General Rules for X-ray Fluorescence Spectrometric Analysis of Iron and Steel
- KS D 1654-2003(2016) General rules for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 2710-2019 Methods for X-ray fluorescence spectrometric analysis of ferroniobium
- KS E 3045-2002(2007) X-ray fluorescence spectrometric analysis for iron ores
- KS D 1655-1993 Method for X-Ray Fluorescence Spectrometric Analysis of Iron and Steel
- KS M 0017-1995 General rules for X-ray fluorescence spectrometric analysis
- KS D 1898-2019 Copper alloys —Methods for X-ray fluorescence spectrometric analysis
- KS L 3316-2014 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS D 1686-2011(2021) Method for x-ray fluorescence spectrometric analysis of ferroalloys
- KS L 3316-2014(2019) Method for X-ray fluorescence spectrometric analysis of refractory products
- KS L 3316-1998 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS L 3316-1988 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS E 3076-2017 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
- KS E 3076-2022 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
- KS L 5222-2009(2019) Chemical analysis method of cement by x-ray fluorescence
- KS D ISO 14706-2003(2018)
- KS M 1068-2005 Qualitative/quantitative screening by XRF spectrometry
- KS L 3316-2009 Method for X-ray fluorescence spectrometric analysis of refractory brikcs and refractory mortars
- KS D 2597-1996(2021) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
- KS E 3076-2002 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
- KS E 3075-2017 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
- KS E 3075-2022 Method for X-ray fluorescence spectrometric analysis of limestone and dolomite
- KS E 3075-2002 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
- KS D 1655-2008(2019) Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1686-2011(2016) Method for x-ray fluorescence spectrometric analysis of ferroalloys
- KS D 2597-1996(2016) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
- KS D ISO 15472-2003(2018)
- KS M ISO 14597:2003 Petroleum products－Determination of vanadium and nickel content－Wavelength-dispersive X-ray fluorescence spectrometry
- KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
- KS E ISO 10086-2:2007 Coal－Methods for evaluating flocculants for use in coal preparation－Part 2：Flocculants as filter aids in rotary vacuum filtration systems
- KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
- KS D ISO 17054:2018 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near-by technique
- KS D ISO 14706:2003 Surface chemical analysis－Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
- KS L ISO 21587-2:2012 Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)－Part 2：Wet chemical analysis
工业和信息化部, X-ray stress analysis and X-ray diffraction analysis
- YS/T 1178-2017 Aluminum slag phase analysis X-ray diffraction method
- YB/T 172-2020 Quantitative phase analysis of silica bricks by X-ray diffraction method
- YS/T 1344.3-2020 Chemical analysis method of tin-doped indium oxide powder Part 3: Phase analysis X-ray diffraction analysis method
- YS/T 1160-2016 Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K value method
- YS/T 483-2022 Analysis methods for copper and copper alloys X-ray fluorescence spectrometry (wavelength dispersion type)
- YS/T 1033-2015 Determination of element content of dry anti-seepage materials by X-ray fluorescence spectrometry
German Institute for Standardization, X-ray stress analysis and X-ray diffraction analysis
- DIN EN 15305:2009-01 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
- DIN EN 15305 Berichtigung 1:2009-04 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
- DIN EN 15305:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
- DIN EN 15305 Berichtigung 1:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
- DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
- DIN EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods English version of DIN EN 12698-2:2007-06
- DIN 51418-2 Bb.1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
- DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
- DIN 55912-2 Bb.2:1999 Pigments - Titanium dioxide pigments - Methods of analysis; establishing a calibration graph using the X-ray fluorescence analysis
- DIN EN 13925-1:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
- DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN EN 1330-11:2007-09 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycristalline and amorphous materials; Trilingual version EN 1330-11:2007
- DIN 55912-2 Bb.1:1999 Pigments - Titanium dioxide pigments; methods of analysis - Examples using the X-ray fluorescence analysis to determine minor constituents
- DIN EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21587-2:2007); English version of DIN EN ISO 21587-2:2007-12
- DIN EN ISO 21587-2:2007-12 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21587-2:2007); German version EN ISO 21587-2:2007
- DIN EN ISO 12677:2013-02 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011); German version EN ISO 12677:2011
Association Francaise de Normalisation, X-ray stress analysis and X-ray diffraction analysis
- NF EN 15305:2009 Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par diffraction des rayons X
- NF A09-185*NF EN 15305:2009 Non-destructive testing - Test Method for Residual Stress analysis by X-ray Diffraction.
- NF A09-285:1999 Non destructive testing - Test methods for residual stress analysis by X-ray diffraction
- NF T25-111-3:1991 Carbon fibres- Texture and structure- Part 3: Azimutal analysis of the diffraction of the X-rays
- NF X43-600-2*NF ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by x-ray diffraction - Part 2 : method by indirect analysis
- NF B49-422-2*NF EN 12698-2:2008 Chemical analysis of nitride bonded silicon carbide refractories - Part 2 : XRD methods.
- NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
- NF EN 13925-2:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 2 : procédures
- NF S92-502:2006 Medical biology analysis laboratory - Anthroporadiametric - Lungs countings - Measurements of low energy X and gamma emitters (less than 200 keV).
- NF EN 13925-3:2005 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 3 : appareillage
- NF EN ISO 12677:2011 Analyse chimique des matériaux réfractaires par fluorescence de rayons X - Méthode de la perle fondue
- NF EN 13925-1:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 1 : principes généraux
- NF X43-600-1*NF ISO 16258-1:2015 Workplace Air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: direct-on-filter method
- NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
- NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
- NF EN 1330-11:2007 Essais non destructifs - Terminologie - Partie 11 : diffraction des rayons X de matériaux polycristallins et amorphes
- NF M07-095*NF EN ISO 14597:1999 Petroleum products. Determination of vanadium and nickel content. Wavelength-dispersive X-ray fluorescence spectrometry.
- NF A09-280-1*NF EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1 : general principles.
- NF ISO 16258-2:2015 Air des lieux de travail - Fraction alvéolaire de la silice cristalline par diffraction de rayons X - Partie 2 : méthode indirecte d'analyse
- NF ISO 16258-1:2015 Air des lieux de travail - Fraction alvéolaire de la silice cristalline par diffraction de rayons X - Partie 1: méthode directe d'analyse sur filtre
- NF X11-683:1981
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
- NF A11-103:1977 Chemical analysis of ferroniobium. Determination of niobium by X ray fluorescence spectrometry.
- XP A06-379-1999 Guidelines for the preparation of standard routine methods with wavelength-dispersive X-ray fluorescence spectrometry.
- NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
- NF A09-020-11*NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11 : Terms used in X-ray diffraction from polycrystalline and amorphous materials.
- NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
- NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
- NF B40-677*NF EN ISO 12677:2011 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method
Professional Standard - Ferrous Metallurgy, X-ray stress analysis and X-ray diffraction analysis
- YB/T 172-2000 Phase quantitative analysis of silica bricks.X-ray diffraction method
- YB/T 5320-2006 X-ray Diffraction K Value Method for Quantitative Phase Analysis of Metallic Materials
- YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method
- YB/T 4177-2008 Determination of chemical composition in stag by X-ray fluorescence spectrometry
Professional Standard - Electricity, X-ray stress analysis and X-ray diffraction analysis
- DL/T 1151.22-2012 Analytical methods of scale and corrosion products in power plants.Part 22: standard test methods of X-ray fluorescence spectrometry and X-ray diffraction
未注明发布机构, X-ray stress analysis and X-ray diffraction analysis
- BS EN 15305:2008(2009) Non - destructive Testing — Test Method for Residual Stress analysis by X - ray Diffraction
- BS EN ISO 12677:2011(2014) Chemical analysis of refractory products by X - ray fluorescence (XRF) — Fused cast - bead method
- BS 6870-3:1989(1999) Analysis of aluminium ores — Part 3 : Method for multi - element analysis by wavelength dispersive X - ray fluorescence
American National Standards Institute （ANSI), X-ray stress analysis and X-ray diffraction analysis
- ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
Danish Standards Foundation, X-ray stress analysis and X-ray diffraction analysis
- DS/EN 15305/AC:2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
- DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
- DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
- DS/CEN/TR 10354:2012 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
- DS/EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
- DS/EN ISO 12677:2011 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method
Lithuanian Standards Office , X-ray stress analysis and X-ray diffraction analysis
- LST EN 15305-2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
- LST EN 15305-2008/AC-2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- LST EN 13925-1-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
AENOR, X-ray stress analysis and X-ray diffraction analysis
- UNE-EN 15305:2010 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
- UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
- UNE-EN 1330-11:2008 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycrystalline and amorphous materials
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray stress analysis and X-ray diffraction analysis
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 5225-1985 Metal materials--Quantitative phase analysis--"value K" method of x-ray diffraction
- GB/T 30904-2014 Inorganic chemicals for industrial use.Crystal form analysis.X-ray diffraction method
- GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
- GB/T 19140-2003 Technologic rules for X-ray fluorescence analysis of cements
- GB/T 42360-2023 Total Reflection X-ray Fluorescence Spectroscopic Analysis of Water for Surface Chemical Analysis
- GB/T 13710-1992 Blank detail specificationn of X-ary tubes for analysis
- GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
- GB/T 16597-1996 Analytical methods of metallurgical products. General rule for X-ray fluorescence spectrometric methods
- GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
- GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
- GB/Z 42520-2023 Guidelines for X-ray fluorescence spectrometric laboratory practice for the analysis of iron ores
- GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
- GB/T 6609.32-2009 Chemical analysis methods and determination of physical performance of alumina.Part 32:Determination of а-alumina content by X-ray diffraction
- GB/T 29513-2013 Chemical analysis of ferric-containing dust and sludge by XRF.Fused cast bead method
- GB/T 21114-2007 X-ray Fluorescence Spectrochemical Analysis of Refractory Materials - Molten Glass Disk Method
- GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
- GB/T 8156.10-1987 Aluminium fluoride for industrial use--Determination of sulphur content--X-ray fluorescence spectrometric method
- GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
- GB/T 17416.2-1998 Method for chemical analysis of Zirconium ores.Determination of Zirconium and Hafnium contents.X-ray fluorescence spectrometric method
- GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
- GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
国家市场监督管理总局、中国国家标准化管理委员会, X-ray stress analysis and X-ray diffraction analysis
- GB/T 36923-2018 Identification of pearl powder―X-ray diffraction analysis
- GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
- GB/T 16597-2019 Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods
- GB/T 21114-2019 Refractories—Chemical analysis by X-ray fluorescence(XRF)—Fused cast-bead method
- GB/T 40110-2021 Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Japanese Industrial Standards Committee (JISC), X-ray stress analysis and X-ray diffraction analysis
- JIS K 0131:1996 General rules for X-ray diffractometric analysis
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
- JIS M 8205:1983 X-ray fluorescence spectrometric analysis for iron ores
- JIS G 1256:1997 Iron and steel -- Method for X-ray fluorescence spectrometric analysis
- JIS G 1256:1982 Fluorescence X-ray analysis method of steel
- JIS H 1292:2018 Copper alloys -- Methods for X-ray fluorescence spectrometric analysis
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS H 1292:2005 Methods for X-ray fluorescence spectrometric analysis of copper alloys
- JIS R 2216:2005 Methods for X-ray fluorescence spectrometric analysis of refractory products
- JIS H 1292:1997 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
- JIS H 1287:2015 Nickel and nickel alloys -- Methods for X-ray fluorescence spectrometric analysis
- JIS H 1631:2008 Titanium alloys -- Method for X-ray fluorescence spectrometric analysis
- JIS G 1256 AMD 1:2010 Iron and steel -- Method for X-ray fluorescence spectrometric analysis (Amendment 1)
- JIS G 1351:2006 Ferroalloys -- Method of X-ray fluorescence spectrometric analysis
- JIS G 1204:1978 General rules for fluorescent X-ray analysis of iron and steel
- JIS G 1256 AMD 2:2013 Iron and steel.Method for X-ray fluorescence spectrometric analysis (Amendment 2)
- JIS A 1481-3:2014 Determination of asbestos in building material products -- Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method
- JIS H 1669:1990 Method for X-ray fluorescence spectrometric analysis of zirconium alloys
- JIS G 1351:1987 Method for X-ray fluorescence spectrometric analysis of ferroalloys
- JIS R 2216:1995 Method for X-ray fluorescence spectrometric analysis of refractory bricks and refractory mortars
- JIS R 5204:2002 Chemical analysis method of cement by x-ray fluorescence
- JIS R 5204:2019 Chemical analysis method of cement by X-ray fluorescence
- JIS A 1481-3 AMD 1:2022 Determination of asbestos in building material products -- Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method (Amendment 1)
- JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
- JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- JIS Z 4752-2-6:2001 Evaluation and routine testing in medical imaging departments -- Part 2-6: Constancy tests -- X-ray equipment for computed tomography
- JIS Z 4752-2-6:2012 Evaluation and routine testing in medical imaging departments -- Part 2-6: Constancy tests -- Imaging performance of computed tomography X-ray equipment
British Standards Institution (BSI), X-ray stress analysis and X-ray diffraction analysis
- BS EN 15305:2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction
- BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
- DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
- BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
- BS DD ISO/TS 13762:2002 Particle size analysis - Small angle X-ray scattering method
- BS ISO 16258-2:2015 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Method by indirect analysis
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
- PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- BS ISO 16258-1:2015 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Direct-on-filter method
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
- BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
- BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 29581-2:2010 Cement - Test methods - Chemical analysis by X-ray fluorescence
- BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Wet chemical analysis
- BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- BS EN ISO 10058-2:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method). Wet chemical analysis
- BS EN ISO 10058-2:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO
10058-2:2008)
- BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- PD ISO/TR 12389:2009 Methods of testing cement. Report of a test programme. Chemical analysis by x-ray fluorescence
- BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- BS EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - XRD methods
- BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- 23/30446996 DC BS EN ISO 21068-4. Chemical analysis of raw materials and refractory products containing silicon carbide, silicon nitride, silicon oxynitride and sialon - Part 4. XRD methods
- BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Occupational Health Standard of the People's Republic of China, X-ray stress analysis and X-ray diffraction analysis
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
International Organization for Standardization (ISO), X-ray stress analysis and X-ray diffraction analysis
- ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
- ISO/TS 13762:2001 Particle size analysis - Small angle X-ray scattering method
- ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 2: Method by indirect analysis
- ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
- ISO/TS 18507:2015 Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
- ISO 16258-1:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: Direct-on-filter method
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- ISO 29581-2:2010 Cement - Test methods - Part 2: Chemical analysis by X-ray fluorescence
- ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
- ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
- ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
- ISO 12677:2011 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method
- ISO 12980:2000 Carbonaceous materials used in the production of aluminium - Green coke and calcined coke for electrodes - Analysis using an X-ray fluorescence method
- ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
- ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
RU-GOST R, X-ray stress analysis and X-ray diffraction analysis
Professional Standard - Petroleum, X-ray stress analysis and X-ray diffraction analysis
- SY/T 5163-1995 X-ray Diffraction Analysis Method for Relative Content of Clay Minerals in Sedimentary Rocks
- SY/T 5163-2010 Analysis method for clay minerals and ordinary non-clay minerals in sedimentary rocks by the X-ray diffraction
- SY/T 6210-1996 X-ray Diffraction Quantitative Analysis Method of Total Clay Minerals and Common Non-clay Minerals in Sedimentary Rocks
American Society for Testing and Materials (ASTM), X-ray stress analysis and X-ray diffraction analysis
- ASTM E1621-21 Standard Guide for X-Ray Emission Spectrometric Analysis
- ASTM E1361-90(1999) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
- ASTM E1361-02(2021) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
- ASTM E3294-22 Standard Guide for Forensic Analysis of Geological Materials by Powder X-Ray Diffraction
- ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
- ASTM E1085-95(2004) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
- ASTM E1085-95(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
- ASTM E1085-95(2004)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
- ASTM E322-96e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels and Cast Irons
- ASTM E572-94(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
- ASTM E572-02a(2006)e1 Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
- ASTM E572-02a(2006) Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
- ASTM E572-02a Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
- ASTM E572-94(2000)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
- ASTM D5380-93(2003) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM D5380-93(2021) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM D5381-93(2003) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
- ASTM D5381-93(1998) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
- ASTM E322-96(2004) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels and Cast Irons
- ASTM C1271-99(2006) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
- ASTM C1271-99(2012) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
- ASTM E1361-02 Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
- ASTM E1361-02(2007) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
- ASTM E1361-02(2014)e1 Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
- ASTM C1271-99 Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
- ASTM C1271-99(2020) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
- ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM C1365-06 Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
- ASTM C1365-06(2011) Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
- ASTM E2465-11e1 Standard Test Method for Analysis of Ni-Base Alloys by Wavelength Dispersive X-Ray Fluorescence Spectrometry
- ASTM E539-90(1996)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of 6AI-4V Titanium Alloy
- ASTM E539-02 Standard Test Method for X-Ray Emission Spectrometric Analysis of 6AI-4V Titanium Alloy
- ASTM E539-06 Standard Test Method for X-Ray Emission Spectrometric Analysis of 6Al-4V Titanium Alloy
- ASTM C1365-98 Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
- ASTM C1365-98(2004) Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
- ASTM D5380-93(2009) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E1621-13 Standard Guide for Elemental Analysis by Wavelength Dispersive X-Ray Fluorescence Spectrometry
- ASTM D5380-93(1998) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM D5380-93(2014) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM C1365-18 Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
- ASTM D2332-84(1999) Standard Practice for Analysis of Water-Formed Deposits by Wavelength-Dispersive X-Ray Fluorescence
- ASTM E539-11 Standard Test Method for Analysis of Titanium Alloys by X-Ray Fluorescence Spectrometry
- ASTM E1085-09 Standard Test Method for Analysis of Low-Alloy Steels by X-Ray Fluorescence Spectrometry
- ASTM E2465-19 Standard Test Method for Analysis of Ni-Base Alloys by X-ray Fluorescence Spectrometry
- ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
- ASTM C1416-99 Standard Test Method for Uranium Analysis in Natural and Waste Water by X-Ray Fluorescence
- ASTM C1416-04 Standard Test Method for Uranium Analysis in Natural and Waste Water by X-Ray Fluorescence
- ASTM C1416-04(2009) Standard Test Method for Uranium Analysis in Natural and Waste Water by X-Ray Fluorescence
Professional Standard - Machinery, X-ray stress analysis and X-ray diffraction analysis
- JB/T 9401-1999 Side window fluorescence analysis X-ray tube
- JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
- JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
Professional Standard - Nuclear Industry, X-ray stress analysis and X-ray diffraction analysis
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
- EJ/T 1067-1998 Americium-241 sources fluorescence analysis for X-ray
- EJ/T 1068-1998 Plutonium-238 sources fluorescence analysis for x-ray
- EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis
- EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
- EJ/T 684-2016 Portable Energy Dispersive X-ray Fluorescence Analyzer
Professional Standard - Building Materials, X-ray stress analysis and X-ray diffraction analysis
Professional Standard - Customs, X-ray stress analysis and X-ray diffraction analysis
- HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer
国家能源局, X-ray stress analysis and X-ray diffraction analysis
- SY/T 5163-2018 X-ray diffraction analysis method of clay minerals and common non-clay minerals in sedimentary rocks
European Committee for Standardization (CEN), X-ray stress analysis and X-ray diffraction analysis
- EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
- EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
- EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
- PD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
- EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 1: General principles
KR-KS, X-ray stress analysis and X-ray diffraction analysis
International Electrotechnical Commission (IEC), X-ray stress analysis and X-ray diffraction analysis
- IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, X-ray stress analysis and X-ray diffraction analysis
- GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
- GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
- GB/T 35734-2017 Portable tube-excited X-ray fluorescence analysis equipment－Classification, safety requirements and test
Taiwan Provincial Standard of the People's Republic of China, X-ray stress analysis and X-ray diffraction analysis
- CNS 11942.23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
- CNS 11942-23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
Professional Standard - Education, X-ray stress analysis and X-ray diffraction analysis
- JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
- JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
Guangdong Provincial Standard of the People's Republic of China, X-ray stress analysis and X-ray diffraction analysis
- DB44/T 1602-2015 Analysis Method of Stone Composition--X-ray Fluorescence Spectrometry
Professional Standard - Non-ferrous Metal, X-ray stress analysis and X-ray diffraction analysis
- YS/T 869-2013 Chemical analysis of 4A-Zeolite.X-ray fluorescence spectrometric method
- YS/T 483-2005 Methods for analysis of copper and copper alloys-X-Ray fluorescence spectrometric (wavelength dispersive)
Institute of Electrical and Electronics Engineers (IEEE), X-ray stress analysis and X-ray diffraction analysis
- IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers
Professional Standard - Geology, X-ray stress analysis and X-ray diffraction analysis
- DZ/T 0370-2021 Technical regulations for portable X-ray fluorescence on-site analysis
IN-BIS, X-ray stress analysis and X-ray diffraction analysis
National Metrological Technical Specifications of the People's Republic of China, X-ray stress analysis and X-ray diffraction analysis
- JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
Professional Standard - Commodity Inspection, X-ray stress analysis and X-ray diffraction analysis
- SN/T 2079-2008 Method for analysis of stainless and alloy steels.X-ray fluorescence spectrometry
ES-UNE, X-ray stress analysis and X-ray diffraction analysis
- UNE 53934:2016 Plastics. Elemental analysis in polymeric materials by X-ray fluorescence method
工业和信息化部/国家能源局, X-ray stress analysis and X-ray diffraction analysis
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
Standard Association of Australia （SAA）, X-ray stress analysis and X-ray diffraction analysis
(U.S.) Ford Automotive Standards, X-ray stress analysis and X-ray diffraction analysis
Fujian Provincial Standard of the People's Republic of China, X-ray stress analysis and X-ray diffraction analysis
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Shandong Provincial Standard of the People's Republic of China, X-ray stress analysis and X-ray diffraction analysis
- DB37/T 266-1999 X-ray fluorescence analysis method for the determination of the amount of waste slag added in building material products