ZH
RU
ES
Quartz crystal components
Quartz crystal components, Total:50 items.
In the international standard classification, Quartz crystal components involves: Electronic components in general, Piezoelectric and dielectric devices.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Quartz crystal components
- GB/T 12273-1996 Quartz crystal units--A specification in the Quality Assessment System for Electronic Components--Part 1: Generic specification
- GB/T 16516-1996 Quartz crystal units--A specification in the Quality Assessment System for Electronic Components. Part 2: Sectional specification--Capability approval
- GB/T 16517-1996 Quartz crystal units--A specification in the Quality Assessment System for Electronic Components. Part 3: Sectional specification--Qualification approval
- GB/T 12273.501-2012 Quartz crystal units.A specification in the quality assessment system for electronic components.Part 5.1:Blank detail specification.Qualification approval
- GB/T 22319.7-2015 Measurement of quartz crystal unit parameters.Part 7:Measurement of activity dips of quartz crystal units
- GB/T 22319.8-2008 Measurement of quartz crystal unit parameters.Part 8:Test fixture for surface mounted quartz crystal units
- GB/T 15020-1994 Quartz crystal units for use in electronic equipment.Bland detail specification for.Resistance welded quartz crystal units.Assessment level E
British Standards Institution (BSI), Quartz crystal components
- BS EN 60444-9:2007 Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units
- BS EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Crystal units with thermistors
- BS EN 60444-7:2004 Measurement of quartz crystal unit parameters - Measurement of activity and frequency dips of quartz crystal units
- BS EN 60444-8:2003 Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units
- BS EN 60444-8:2017 Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
International Electrotechnical Commission (IEC), Quartz crystal components
- IEC 61178-2:1993 Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 2: sectional specification; capability approval
- IEC 61178-3:1993 Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 3: sectional specification; qualification approval
- IEC 61178-2-1:1993 Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 2: sectional specification; capability approval; section 1: blank detail specification
- IEC 61178-3-1:1993 Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 3: sectional specification; qualification approval; section 1: blank detail specification
- IEC 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
- IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Korean Agency for Technology and Standards (KATS), Quartz crystal components
- KS C IEC 61178-2:2018 Quartz crystal units — A specification in the IEC Quality Assessment System for Electronic Components (IECQ) — Part 2: Sectional specification – Capability approval
- KS C IEC 61178-2-2023 IEC Electronic Components Quality Assessment System (IECQ) Specification for Quartz Crystal Components Part 2: Sub-Specification Capability Recognition
- KS C IEC 61178-3-1-2002(2017) Quartz crystal units－A specification in the IEC quality assessment system for electronic components(IECQ)－Part 3：Sectional specification－Qualification approval－Section 1：Blank detail specification
- KS C IEC 61178-2-1-2002(2017) Quartz crystal units－A specification in the IEC quality assessment system for electronic components(IECQ)－Part 2：Sectional specification－Capability approval－Section 1：Blank detail specification
- KS C IEC 60122-2-1:2011 Quartz crystal units for frequency control and selection－Part 2：Guide to the use of quartz crystal units for frequency control and selection－Section one：Quartz crystal units for microprocessor clock supply
- KS C 6504-1987(2017) Ovens for Quartz Crystal Units
- KS C IEC 60444-8-2016(2021) Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
- KS C IEC 60444-7-2016(2021) Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
KR-KS, Quartz crystal components
- KS C IEC 61178-2-2018 Quartz crystal units — A specification in the IEC Quality Assessment System for Electronic Components (IECQ) — Part 2: Sectional specification – Capability approval
- KS C IEC 60444-8-2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
Professional Standard - Electron, Quartz crystal components
- SJ/T 10707-1996 Quartz crystal units-A specification in the Quality Assessment System for Electronic Components.Part 2:Sectional specification-Capability approval.Section 1:Blank detail specification
- SJ/T 10708-1996 Quartz crystal units-A specification in the Quality Assessment System for Electronic Conponents.Part 3:Sectional specification-Qualification approval.Section 1:Blank detail specification
- SJ/T 10639-1995 Quartz crystal unit terms
- SJ 52138.1-1995 Crystal unit,quartz,type JA 538,detail specification for
- SJ/Z 9570.1-1995 Quartz crystal component quality grading standard
- SJ/T 9570.1-1995 Quality grading standard for quartz crystal units
Military Standard of the People's Republic of China-General Armament Department, Quartz crystal components
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Quartz crystal components
- GB/T 22319.9-2018 Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal units
Japanese Industrial Standards Committee (JISC), Quartz crystal components
ES-UNE, Quartz crystal components
- UNE-EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units (Endorsed by Asociación Española de Normalización in May of 2017.)
- UNE-EN 60444-7:2004 Measurement of queartz crystal unit parameters -- Part 7: Measurement of activity and frequency dips of quartz crystal units (Endorsed by AENOR in September of 2004.)
Professional Standard - Aerospace, Quartz crystal components
- QJ 2979-1997 Detail specification for XJ33 type quartz crystal components
- QJ 2980-1997 Detailed specifications for XJ36 quartz crystal elements
- QJ 2981-1997 Detailed specifications for XJ39 quartz crystal elements
- QJ 2978-1997 Detailed specifications for XJ17 quartz crystal elements
- QJ 2929-1997 Detail specification for XJ42 type quartz crystal element
Association Francaise de Normalisation, Quartz crystal components
- NF C93-621-8:2005 Measurement of quartz crystal unit parameters - Part 8 : test fixture for surface mounted quartz crystal units.
European Committee for Electrotechnical Standardization（CENELEC）, Quartz crystal components
- EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
German Institute for Standardization, Quartz crystal components
- DIN EN 60444-8:2004 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003); German version EN 60444-8:2003